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| The threshold voltage degradation of MOSFET in heavy-ion single event effect test 会议论文 Beijing, China, May 16, 2018 - May 18, 2018 作者: Zhang, Zeming; Ma, Yingqi; Li, Dan; Tong, Chao; Guo, Xiaoxiao 收藏  |  浏览/下载:23/0  |  提交时间:2019/12/26 |
| Constant voltage stress characterization of nFinFET transistor during total ionizing dose experiment 会议论文 作者: Li BH(李彬鸿); Huang Y(黄杨); J.Wu; Huang YB(黄云波); Li B(李博) 收藏  |  浏览/下载:36/0  |  提交时间:2019/05/13 |
| The total ionizing dose response of leading-edge FDSOI MOSFETs 会议论文 作者: Wang J(王剑); Li BH(李彬鸿); Huang Y(黄杨); K.Zhao; F.Yu 收藏  |  浏览/下载:24/0  |  提交时间:2019/05/13 |
| Process variation dependence of total ionizing dose effects in bulk nFinFETs 会议论文 作者: Li B(李博); Huang YB(黄云波); L.Yang; Zhang QZ(张青竹); Zheng ZS(郑中山) 收藏  |  浏览/下载:46/0  |  提交时间:2019/05/13 |
| The total ionizing dose effect of magnetometers system based on tunneling magnetoresistance sensor 会议论文 作者: Li Huang; Tianyang Zhang; Bo Li; Yu Zhang; Yuhong Zhao 收藏  |  浏览/下载:28/0  |  提交时间:2019/05/10 |
| Total Ionizing Dose Characterization of a SRAM in 28nm UTBB FDSOI Technology 会议论文 作者: Qiwen Zheng; mengxin Liu; Jiangwei Cui; Shanxue Xi; Ying Wei 收藏  |  浏览/下载:33/0  |  提交时间:2019/05/10 |
| The Increased Single-Event Upset Sensitivity of 65-nm DICE SRAM Induced by Total Ionizing Dose 会议论文 Geneva, SWITZERLAND, OCT 02-06, 2017 作者: Zheng, Qiwen; Cui, Jiangwei; Lu, Wu; Guo, Hongxia; Liu, Jie 收藏  |  浏览/下载:40/0  |  提交时间:2018/10/08
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| The total ionizing dose effect on SiO2 and new high-k gate dielectrics under gamma-ray irradiation 会议论文 作者: Ding, Man; Cheng, Yonghong 收藏  |  浏览/下载:13/0  |  提交时间:2019/11/19
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| An Effective Method to Compensate Total Ionizing Dose-Induced Degradation on Double-SOI Structure 会议论文 作者: Huang, Yang; Li, Binhong; Zhao, Xing; Zheng, Zhongshan; Gao, Jiantou 收藏  |  浏览/下载:16/0  |  提交时间:2019/11/26
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| Synergistic effect of mixed neutron and gamma irradiation in bipolar operational amplifier OP07 会议论文 作者: Liu Yan; Chen Wei; Yang Shanchao; Jin Xiaoming; He Chaohui 收藏  |  浏览/下载:3/0  |  提交时间:2019/12/02
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