CORC

在结果中检索

CORC

浏览/检索结果: 共8条，第1-8条 帮助

限定条件    
已选(0)清除 条数/页：   排序方式：
P-doped SiO2 Proton Conducting Films for Low Voltage Thin Film Transistors 会议论文
0, 0, 0
Guo LQ(郭立强); Liqiang Guo * a, Zhaojun Guob, Yuanyuan Yangc and Jumei Zhoud
收藏  |  浏览/下载：16/0  |  提交时间：2013/12/16
Funding for Clean Energy R&D by the Chinese Academy of Sciences 会议论文
2010 international chemical congress of pacific basin societies, 夏威夷, 2010-12-15
包信和
收藏  |  浏览/下载：23/0  |  提交时间：2012/07/09
A first-principles study of adsorption of metal adatoms on ultrathin oxide film FeO/Ru(0001) in the presence of CO 会议论文
18th international vacuum congress, 中国, 2010-8-23
欧阳润海; 李微雪
收藏  |  浏览/下载：15/0  |  提交时间：2011/07/11
An innovated process of Pt/PbTiO3/PbZr0.3Ti0.7O3/PbTiO3/Pt integrated ferroelectric capacitors for FeRAM 会议论文
INTEGRATED FERROELECTRICS, 18th International Symposium on Integrated Ferroelectrics, Honolulu, HI, Web of Science
Wang, Longhai; Yu, Jun; Wen, Xin'yi; Wang, Yunbo; Gao, Junxiong; Liu, Feng; Wei, Chao-Gang; Ren, Tian-Ling
收藏  |  浏览/下载：4/0
Optical characteristic of ion beam sputter deposited aluminum thin films (EI CONFERENCE) 会议论文
International Symposium on Photoelectronic Detection and Imaging, ISPDI 2007: Optoelectronic System Design, Manufacturing, and Testings, September 9, 2007 - September 12, 2007, Beijing, China
Jin W.; Jin C.; Zhu H.; Liu L.; Yang H.
收藏  |  浏览/下载：19/0  |  提交时间：2013/03/25
Aluminum is a typical active metal very easy to oxidize. An oxide surface layer of about 2-6nm quickly formed in air which adds difficulty to the optical constants determination. An ex-situ method is used to determine the optical constants of aluminum thin films. First  Second  Third  alumina (Al2O3) thin film is deposited by ion beam sputter deposition. The optical constants and thickness are determined by spectral ellipsoemtry (SE). The thickness is verified by grazing x-ray reflection (GXRR) fitting method  Al thin film with an Al2O3 cap layer on top is deposited. This cap layer is of the same deposition condition with the first step. By fitting the GXRR spectra  based on the acquired structure information  the structure information (the thickness of the aluminum and the cap layer  the ellipsometric spectra are fitted. The optical constants of the aluminum layer are extracted with the aid of the Drude model. Finally  surface roughness and the diffusion between Al-Al2O 3) is obtained  an induced transmission filter (ITF) is designed and deposited.  
Thickness effect and mesoscopic character of the metal oxide gas sensing nano-thin films 会议论文
China International Conference on Nanoscience and Technology (ChinaNANO 2005), JUN 09-11, 2005
作者:  Xing Jianping;  Li Juan;  Zhou Lei;  Li Jianming;  Qiu Nanyuan
收藏  |  浏览/下载：1/0  |  提交时间：2019/12/31
Metal-free growth of Si/SiO2 nanowires by annealing SiOx (x < 2) films deposited by PECVD 会议论文
symposium on group-4 semiconductor nanostructures held at the 2004 mrs fall meeting, boston, ma, nov 29-dec 02, 2004
Wang, XX; Zhang, JG; Wang, QM
收藏  |  浏览/下载：202/48  |  提交时间：2010/03/29
Hetero-epitaxial growth of ZnO films on silicon by low-pressure metal organic chemical vapor deposition 会议论文
7th international conference on solid-state and integrated circuits technology, beijing, peoples r china, oct 18-21, 2004
Wang, QY; Shen, WJ; Wang, J; Wang, JH; Zeng, YP; Li, JM
收藏  |  浏览/下载：195/31  |  提交时间：2010/03/29

©版权所有 ©2017 CSpace - Powered by CSpace