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大连理工大学 [15]
华南理工大学 [5]
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上海大学 [1]
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会议论文 [22]
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Effect of intermetallic compound thickness on tensile behavior of Cu/Sn/Cu micro interconnects
会议论文
2017 18TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY (ICEPT), 2017-01-01
作者:
Kuang, Jiameng
;
Yang, Fan
;
Huang, Mingliang
收藏
  |  
浏览/下载:9/0
  |  
提交时间:2019/12/03
Cu/Sn/Cu interconnect
thermal aging
tensile test
failure analysis
interfacial reaction
thickness
Effect of Sn grain orientation on Ni substrate dissolution and intermetallic compounds precipitation in Cu/Sn/Ni interconnect undergoing electromigration
会议论文
2017 18TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY (ICEPT), 2017-01-01
作者:
Liu, XingBo
;
Huang, Mingliang
收藏
  |  
浏览/下载:3/0
  |  
提交时间:2019/12/03
electromigration
Sn grain orientation
Ni substrate
dissolution
IMC precipitation
An Overview of Carbon Nanotubes Based Interconnects for Microelectronic Packaging
会议论文
2017 IMAPS NORDIC CONFERENCE ON MICROELECTRONICS PACKAGING (NORDPAC), 2017-01-01
作者:
Chen, Shujing[1]
;
Shan, Bo[2]
;
Yang, Yiqun[3]
;
Yuan, Guangjie[4]
;
Huang, Shirong[5]
收藏
  |  
浏览/下载:17/0
  |  
提交时间:2019/04/24
Interconnect
CNTs based bumps
CNTs basednTSVs
resistivity
CNTs-Cu nanocomposite
Effect of Electromigration on Interfacial Reaction in Cu/Sn-9Zn/Cu and Cu/Sn-9Zn/Ni Interconnects
会议论文
17th International Conference on Electronic Packaging Technology (ICEPT), Chinese Inst Elect, Elect Mfg & Packaging Technol Soc, Wuhan, PEOPLES R CHINA, 2016-08-16
作者:
Zhou, Q.
;
Li, Q.
;
Zhou, Y.
;
Wang, X. J.
;
Huang, M. L.
收藏
  |  
浏览/下载:10/0
  |  
提交时间:2019/12/09
Cu/Sn-9Zn/Cu interconnect
Cu/Sn-9Zn/Ni interconnect
electromigration
interfacial reaction
reverse polarity effect
Effect of Sn grain orientation on Cu diffusion in SnAgCu solder interconnect undergoing electromigration
会议论文
16 int conf elect packaging technology, Chinese Inst Elect,China IEEE Component Packaging, & Mfg Tech Soci IEEE-C, Changsha, PEOPLES R CHINA, 2015-08-11
作者:
Zhao, Jianfei
;
Huang, Mingliang
;
Zhao, Ning
;
Zhang, Zhijie
收藏
  |  
浏览/下载:25/0
  |  
提交时间:2019/12/09
Electromigration
beta-Sn
Grain orientation
Dissolution
Intermetallic compounds
Low Temperature Solid-State-Diffusion Bonding for Fine-Pitch Cu/Sn/Cu Interconnect
会议论文
IEEE 65th Electronic Components and Technology Conference (ECTC), San Diego, CA, 2015-05-26
作者:
Cai, Jian
;
Wang, Junqiang
;
Wang, Qian
;
Liu, Ziyu
;
Wang, Dejun
收藏
  |  
浏览/下载:2/0
  |  
提交时间:2019/12/09
fine-pitch interconnect
solid-state-diffusion bonding
microstructure
Kirkendall voids
Effect of electromigration on the tensile strength of Cu/Sn-9Zn/Cu solder interconnects
会议论文
15th International Conference on Electronic Packaging Technology (ICEPT), Chinese Inst Elect, Chengdu, PEOPLES R CHINA, 2014-08-12
作者:
Huang, Mingliang
;
Zhang, Fei
;
Yang, Fan
;
Zhao, Ning
收藏
  |  
浏览/下载:4/0
  |  
提交时间:2019/12/09
Cu/Sn-9Zn/Cu interconnect
electromigration
tensile strength
intermetallic compound
fracture
Reverse Polarity Effect in Cu/Sn-9Zn/Ni Interconnect under High Current Density at High Temperature
会议论文
15th International Conference on Electronic Packaging Technology (ICEPT), Chinese Inst Elect, Chengdu, PEOPLES R CHINA, 2014-08-12
作者:
Huang, Mingliang
;
Zhang, Zhijie
;
Zhao, Ning
;
Feng, Xiaofei
收藏
  |  
浏览/下载:3/0
  |  
提交时间:2019/12/09
Liquid-solid electromigration (L-S EM)
Sn-9Zn solder
intermetallic compound (IMC)
reverse polarity effect
synchrotron radiation
Study on size effect and cross-interaction in Cu/Sn/Ni-P interconnects
会议论文
15th International Conference on Electronic Packaging Technology (ICEPT), Chinese Inst Elect, Chengdu, PEOPLES R CHINA, 2014-08-12
作者:
Huang, Mingliang
;
Yang, Fan
;
Zhao, Ning
;
Liu, Xiaohua
;
Wang, Jingyun
收藏
  |  
浏览/下载:4/0
  |  
提交时间:2019/12/09
Keywords Size effect
Cross-interaction
Cu/Sn-3Ag-0.5Cu/Ni-P interconnect
Interfacial reaction
Intermetallic compound
Study on Liquid-Solid Electromigration in Cu/Sn-9Zn/Cu Interconnect Using Synchrotron Radiation Real-Time in Situ Imaging Technology
会议论文
14th International Conference on Electronic Packaging Technology (ICEPT), Chinese Inst Elect, Dalian, PEOPLES R CHINA, 2013-08-11
作者:
Huang, Mingliang
;
Zhang, Zhijie
;
Zhao, Ning
;
Feng, Xiaofei
收藏
  |  
浏览/下载:7/0
  |  
提交时间:2019/12/11
liquid-solid electromigration (L-S EM)
Sn-9Zn solder
intermetallic compound (IMC)
reverse polarity effect
synchrotron radiation real-time in situ imaging technology
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