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High density low leakage SRAM standby current reduction with a channel stop implant in p-type well in 40nm CMOS development 会议论文
China Semiconductor Technology International Conference (CSTIC), 2013-03-19
作者:  Li, Yong[1];  Tao, Jiajia[2];  Huang, S.K.[3];  Lin, David[4];  Zhang, Shuai[5]
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