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西安交通大学 [61]

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会议论文 [61]

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浏览/检索结果: 共61条，第1-10条

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限定条件	内容类型：会议论文专题：西安交通大学第一署名单位第一作者单位通讯作者单位

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	Online Junction Temperature Extraction and Aging Detection of IGBT via Miller Plateau Width 会议论文作者: Liu, Jingcun; Zhang, Guogang; Chen, Qian; Qi, Lu; Qin, Zheng 收藏 \| 浏览/下载：13/0 \| 提交时间：2019/11/26 Semiconductor Reliability Failure Indicator IGBT Junction Temperature Condition Monitoring
	Online junction temperature extraction and aging detection of IGBT via Miller plateau width 会议论文作者: Liu, Jingcun; Zhang, Guogang; Chen, Qian; Qi, Lu; Qin, Zheng 收藏 \| 浏览/下载：4/0 \| 提交时间：2019/11/26 Condition Monitoring Failure Indicator IGBT Junction Temperature Semiconductor Reliability
	Characterization of Transient Threshold Voltage Shifts in Enhancement-and Depletion-mode AlGaN/GaN Metal-Insulator-Semiconductor (MIS)-HEMTs 会议论文作者: Cui, Miao; Cai, Yutao; Lam, Sang; Liu, Wen; Zhao, Chun 收藏 \| 浏览/下载：5/0 \| 提交时间：2019/11/26 AlGaN/GaN MIS-HEMTs Frequency dependence Frequency independent High-voltage switching Metal-insulator-semiconductors MIS-HEMT Threshold voltage shifts Voltage hysteresis
	Mechanistic investigation on tuning the conductivity type of cuprous oxide (Cu2O) thin films via deposition potential 会议论文作者: Han, Juan; Chang, Jing; Wei, Rong; Ning, Xiaohui; Li, Jian 收藏 \| 浏览/下载：15/0 \| 提交时间：2019/11/26 Conductivity type Thin film Semiconductor Cuprous oxide (Cu2O) Photoelectrochemistry
	Investigation into Reliability Assessment of Power Semiconductor for Hybrid DC Switch Application 会议论文作者: Liu, Jingcun; Zhang, Guogang; Chen, Qian; Qi, Lu; Qin, Zheng 收藏 \| 浏览/下载：8/0 \| 提交时间：2019/11/26 Power semiconductor Thermo-sensitive electrical parameter (TSEP) Junction temperature Hybrid switching technique Temperature-based condition monitoring
	The Comparison of DC Semiconductor Circuit Breaker and SF6 Circuit Breaker with Transverse Magnetic Field for DC Transmission 会议论文作者: Gao, Lei; Xiang, Bin; Yang, Kun; Liu, Zhiyuan; Geng, Yingsan 收藏 \| 浏览/下载：16/0 \| 提交时间：2019/11/26 Superconducting current limiting DC interruption DC circuit breaker Gas circuit breaker Semiconductor device
	Substrate Effect on Light Emission of SSI-LEDs 会议论文作者: Zhang, Shumao; Kuo, Yue; Zhang, Xiaoning 收藏 \| 浏览/下载：3/0 \| 提交时间：2019/11/26
	The comparison of DC semiconductor circuit breaker and SF6 circuit breaker with transverse magnetic field for DC transmission 会议论文作者: Gao, Lei; Xiang, Bin; Yang, Kun; Liu, Zhiyuan; Geng, Yingsan 收藏 \| 浏览/下载：6/0 \| 提交时间：2019/11/26 DC circuit breaker DC interruption Gas circuit breaker Semiconductor device Superconducting current limiting
	Eliminating Re-Burn-In in Semiconductor Manufacturing through Statistical Analysis of Production Test Data 会议论文作者: Pham, Hung V.; Demidenko, Serge N.; Merola, Giovanni M. 收藏 \| 浏览/下载：6/0 \| 提交时间：2019/11/26 probability logistic regression model statistical analysis integrated circuit manufacturing burn in test
	Research on the Current Commutation in a Novel Hybrid HVDC Circuit Breaker 会议论文作者: Feng, Lei; Gou, Ruifeng; Yang, Xiaoping; Zhuo, Fang; Shi, Shuhuai 收藏 \| 浏览/下载：8/0 \| 提交时间：2019/11/26 Circuits Multi-terminal HVDC HVDC IGBT VSC Semiconductor device Thyristor

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