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Quality assurance test and Failure Analysis of SiPM Arrays of GECAM Satellites 预印本
2021
作者:  Zhang, D. L.;  Gao, M.;  Sun, X. L.;  Li, X. Q.;  An, Z. H.
收藏  |  浏览/下载:17/0  |  提交时间:2021/12/02
Characteristics of high- and low-dose-rate damage for domestic npn transistors of various emitter areas 期刊论文
ACTA PHYSICA SINICA, 2009, 卷号: 58, 期号: 8, 页码: 5572-5577
作者:  Zheng Yu-Zhan;  Lu Wu;  Ren Di-Yuan;  Wang Yi-Yuan;  Guo Qi
收藏  |  浏览/下载:18/0  |  提交时间:2012/11/29


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