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Characterization of GaSb substrate wafers for MOCVD III-V antimonides 期刊论文
DEFECT RECOGNITION AND IMAGE PROCESSING IN SEMICONDUCTORS 1997, 1998, 卷号: 160, 页码: 417-420
Peng, RW; Ding, YQ; Xu, CM; Wang, XG
收藏  |  浏览/下载:6/0  |  提交时间:2012/03/25
CHARACTERIZATION OF CDTE AND HGCDTE EPILAYERS BY HOT-WALL MOCVD 期刊论文
DEFECT RECOGNITION AND IMAGE PROCESSING IN SEMICONDUCTORS AND DEVICES, 1994, 期号: 135, 页码: 347-350
PENG,RW; DING,YQ; WEI,GY
收藏  |  浏览/下载:14/0  |  提交时间:2012/03/25
PHOTOQUENCHING OF ELECTRONIC PARAMAGNETIC-RESONANCE ASGA AND METASTABLE MECHANISM OF EL2 DEFECT IN GAAS 期刊论文
CHINESE PHYSICS, 1989, 卷号: 9, 期号: 4, 页码: 976-981
ZOU, YX; WANG, GY
收藏  |  浏览/下载:8/0  |  提交时间:2012/03/25


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