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A fully three-dimensional atomistic quantum mechanical study on random dopant-induced effects in 25-nm MOSFETs 期刊论文
ieee transactions on electron devices, 2008, 卷号: 55, 期号: 7, 页码: 1720-1726
Jiang, XW; Deng, HX; Luo, JW; Li, SS; Wang, LW
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