QQ客服 官方微博 反馈留言

浏览/检索结果: 共9条，第1-9条 帮助 限定条件 学科主题：光电子学     已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择作者升序作者降序题名升序题名降序发表日期升序发表日期降序提交时间升序提交时间降序 Does an enhanced yellow luminescence imply a reduction of electron mobility in n-type GaN? 期刊论文 journal of applied physics, 2007, 卷号: 102, 期号: 11, 页码: art. no. 113521 Zhao, DG; Jiang, DS; Zhu, JJ; Liu, ZS; Zhang, SM; Liang, JW; Yang, H 收藏  |  浏览/下载：51/5  |  提交时间：2010/03/08 CHEMICAL-VAPOR-DEPOSITION  MOLECULAR-BEAM EPITAXY  X-RAY-DIFFRACTION  MG-DOPED GAN  UNDOPED GAN  PHOTOLUMINESCENCE BANDS  THREADING DISLOCATIONS  POSITRON-ANNIHILATION  GROWTH STOICHIOMETRY  GALLIUM NITRIDE   Effects of grain size on the mosaic tilt and twist in InN films grown on GaN by metal-organic chemical vapor deposition 期刊论文 applied physics letters, 2006, 卷号: 89, 期号: 9, 页码: art.no.092114 Wang H (Wang H.); Huang Y (Huang Y.); Sun Q (Sun Q.); Chen J (Chen J.); Wang LL (Wang L. L.); Zhu JJ (Zhu J. J.); Zhao DG (Zhao D. G.); Zhang SM (Zhang S. M.); Jiang DS (Jiang D. S.); Wang YT (Wang Y. T.); Yang H (Yang H.) 收藏  |  浏览/下载：42/0  |  提交时间：2010/04/11 X-RAY-DIFFRACTION  ELECTRON-TRANSPORT  EPITAXIAL GAN  BAND-GAP  DISLOCATIONS  SAPPHIRE  ALN   Measurement of threading dislocation densities in GaN by wet chemical etching 期刊论文 semiconductor science and technology, 2006, 卷号: 21, 期号: 9, 页码: 1229-1235 作者:  Yang H;  Zhu JJ;  Yang H;  Wang H;  Wang H 收藏  |  浏览/下载：43/0  |  提交时间：2010/04/11 X-RAY-DIFFRACTION   Role of edge dislocations in enhancing the yellow luminescence of n-type GaN 期刊论文 applied physics letters, 2006, 卷号: 88, 期号: 24, 页码: art.no.241917 作者:  Jiang DS;  Zhu JJ;  Li XY;  Zhang SM;  Zhao DG 收藏  |  浏览/下载：47/0  |  提交时间：2010/04/11 CHEMICAL-VAPOR-DEPOSITION  MOLECULAR-BEAM EPITAXY  X-RAY-DIFFRACTION  MG-DOPED GAN  UNDOPED GAN  PHOTOLUMINESCENCE BANDS  THREADING DISLOCATIONS  POSITRON-ANNIHILATION  GROWTH STOICHIOMETRY  GALLIUM NITRIDE   Evolution of mosaic structure in InN grown by metalorganic chemical vapor deposition 期刊论文 journal of crystal growth, 2006, 卷号: 293, 期号: 2, 页码: 269-272 Huang Y (Huang Y.); Wang H (Wang H.); Sun Q (Sun Q.); Chen J (Chen J.); Li DY (Li D. Y.); Zhang JC (Zhang J. C.); Wang JF (Wang J. F.); Wang YT (Wang Y. T.); Yang H (Yang H.) 收藏  |  浏览/下载：49/0  |  提交时间：2010/04/11 growth mode  X-ray diffraction  metalorganic chemical vapor deposition  indium nitride  X-RAY-DIFFRACTION  THREADING DISLOCATIONS  ELECTRON-TRANSPORT  BUFFER LAYER  THIN-FILMS  GAN FILMS  SAPPHIRE  ALN   Structural characterization of AlGaN/GaN superlattices by x-ray diffraction and Rutherford backscattering 期刊论文 superlattices and microstructures, 2006, 卷号: 40, 期号: 3, 页码: 137-143 Zhou SQ (Zhou Shengqiang); Wu MF (Wu M. F.); Yao SD (Yao S. D.); Zhang BS (Zhang B. S.); Yang H (Yang H.) 收藏  |  浏览/下载：24/0  |  提交时间：2010/04/11 nitride semiconductors  superlattice  Rutherford backscattering/channeling  transmission electron microscopy  x-ray diffraction  MULTIPLE-QUANTUM WELLS  OPTICAL-PROPERTIES  INGAN/GAN  STRAIN  INTERFACE  GROWTH  GAN   Effects of edge dislocations and intentional Si doping on the electron mobility of n-type GaN films 期刊论文 applied physics letters, 2006, 卷号: 89, 期号: 11, 页码: art.no.112106 Zhao DG (Zhao D. G.); Yang H (Yang Hui); Zhu JJ (Zhu J. J.); Jiang DS (Jiang D. S.); Liu ZS (Liu Z. S.); Zhang SM (Zhang S. M.); Wang YT (Wang Y. T.); Liang JW (Liang J. W.) 收藏  |  浏览/下载：14/0  |  提交时间：2010/04/11 X-RAY-DIFFRACTION  SCATTERING  GROWTH  LAYERS   Influence of dislocations on photoluminescence of InGaN/GaN multiple quantum wells 期刊论文 applied physics letters, 2005, 卷号: 87, 期号: 7, 页码: art.no.071908 作者:  Jiang DS;  Zhang JC;  Yang H;  Zhang JC;  Zhang JC 收藏  |  浏览/下载：64/14  |  提交时间：2010/03/17 X-RAY-DIFFRACTION   Quality improvement of GaInNAs/GaAs quantum wells grown by plasma-assisted molecular beam epitaxy 会议论文 11th international conference on molecular beam epitaxy (mbe-xi), beijing, peoples r china, sep 11-15, 2000 Li LH; Pan Z; Zhang W; Lin YW; Wang XY; Wu RH 收藏  |  浏览/下载：10/0  |  提交时间：2010/11/15 characterization  defects  X-ray diffraction  molecular beam epitaxy  nitrides  GAAS