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浏览/检索结果: 共5条，第1-5条 帮助 限定条件 发表日期：2018    专题：北京航空航天大学    第一署名单位    第一作者单位    通讯作者单位     已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择作者升序作者降序题名升序题名降序发表日期升序发表日期降序提交时间升序提交时间降序 Propagation path and failure behavior analysis of cracked gears under different initial angles 期刊论文 MECHANICAL SYSTEMS AND SIGNAL PROCESSING, 2018, 卷号: 110, 页码: 90-109 作者:  Chen, Yunxia;  Jin, Yi;  Liang, Xihui;  Kang, Rui 收藏  |  浏览/下载：5/0  |  提交时间：2019/12/30 Time varying mesh stiffness  Crack propagation  Initial angle  Degradation model  Lifetime prediction   Reliability Assessment for Products Subject to Generalized delta-Shock Considering the Threshold of Shock Magnitude 会议论文 2018 3RD INTERNATIONAL CONFERENCE ON SYSTEM RELIABILITY AND SAFETY (ICSRS), 2018-01-01 作者:  Peng, Bo;  Huang, Tingting;  Zhao, Yuepu;  Yu, Zixuan 收藏  |  浏览/下载：11/0  |  提交时间：2019/12/30 degradation modeling  generalized delta-shock  Wiener process  changing degradation rate  lifetime prediction   Reliability Modeling for Products Subject to Generalized Extreme Shock 会议论文 12TH INTERNATIONAL CONFERENCE ON RELIABILITY, MAINTAINABILITY, AND SAFETY (ICRMS 2018), 2018-01-01 作者:  Peng, Bo;  Huang, Tingling;  Yu, Zixuan;  Zhao, Zhanjuan 收藏  |  浏览/下载：4/0  |  提交时间：2019/12/30 Degradation modeling  Wiener process  changing degradation rate  lifetime prediction  generalized extreme shock   Photovoltaic Modules Power Degradation and Lifetime Prediction under Accelerated Damp-heat Conditions Based on Gamma Process 会议论文 2018 INTERNATIONAL CONFERENCE ON POWER SYSTEM TECHNOLOGY (POWERCON), 2018-01-01 作者:  Fan, Jing;  Qian, Zheng;  Wang, Jingyi 收藏  |  浏览/下载：2/0  |  提交时间：2019/12/30 Damp-heat conditions  gamma process  lifetime  photovoltaic module  power degradation   An Alternative Lifetime Model for White Light Emitting Diodes under Thermal-Electrical Stresses 期刊论文 MATERIALS, 2018, 卷号: 11, 页码: 1-11 作者:  Yang, Xi;  Sun, Bo;  Wang, Zili;  Qian, Cheng;  Ren, Yi 收藏  |  浏览/下载：4/0  |  提交时间：2019/12/30 lifetime prediction  light emitting diodes  thermal stress  electrical stress  accelerated degradation test