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Reliability investigation of high-k/metal gate in nMOSFETs by three-dimensional kinetic Monte-Carlo simulation with multiple trap interactions 其他
2016-01-01
Li, Yun; Jiang, Hai; Lun, Zhiyuan; Wang, Yijiao; Huang, Peng; Hao, Hao; Du, Gang; Zhang, Xing; Liu, Xiaoyan
收藏  |  浏览/下载:4/0  |  提交时间:2017/12/03
Reliability investigation of high-k/metal gate in nMOSFETs by three-dimensional kinetic Monte-Carlo simulation with multiple trap interactions 期刊论文
International Conference on Solid State Devices and Materials (SSDM), 2016
Li, Yun; Jiang, Hai; Lun, Zhiyuan; Wang, Yijiao; Huang, Peng; Hao, Hao; Du, Gang; Zhang, Xing; Liu, Xiaoyan
收藏  |  浏览/下载:4/0  |  提交时间:2017/12/03
Evaulation the Degradation in nMOSFETs with HfO2 Gate Dielectric and Interfacial Layer by 3D Kinetic Monte-Carlo Method 其他
2016-01-01
Li, Yun; Lun, Zhiyuan; Wang, Yijiao; Huang, Peng; Jiang, Hai; Zhang, Xing; Du, Gang; Liu, Xiaoyan
收藏  |  浏览/下载:2/0  |  提交时间:2017/12/03
A unified gas-kinetic scheme for continuum and rarefied flows IV: Full Boltzmann and model equations 期刊论文
JOURNAL OF COMPUTATIONAL PHYSICS, 2016
Liu, Chang; Xu, Kun; Sun, Quanhua; Cai, Qingdong
收藏  |  浏览/下载:4/0  |  提交时间:2017/12/03
Insight into PBTI in InGaAs Nanowire FETs with Al2O3 and LaAlO3 Gate Dielectrics 其他
2016-01-01
Li, Y.; Di, S. Y.; Jiang, H.; Huang, P.; Wang, Y. J.; Lun, Z. Y.; Shen, L.; Yin, L. X.; Zhang, X.; Du, G.; Liu, X. Y.
收藏  |  浏览/下载:5/0  |  提交时间:2017/12/03


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