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Microscopic origin of read current noise in TaOx-based resistive switching memory by ultra-low temperature measurement 期刊论文
APPLIED PHYSICS LETTERS, 2016
Pan, Yue; Cai, Yimao; Liu, Yefan; Fang, Yichen; Yu, Muxi; Tan, Shenghu; Huang, Ru
收藏  |  浏览/下载:4/0  |  提交时间:2017/12/03
Reliability investigation of high-k/metal gate in nMOSFETs by three-dimensional kinetic Monte-Carlo simulation with multiple trap interactions 期刊论文
International Conference on Solid State Devices and Materials (SSDM), 2016
Li, Yun; Jiang, Hai; Lun, Zhiyuan; Wang, Yijiao; Huang, Peng; Hao, Hao; Du, Gang; Zhang, Xing; Liu, Xiaoyan
收藏  |  浏览/下载:4/0  |  提交时间:2017/12/03


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