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浏览/检索结果: 共4条，第1-4条 帮助 限定条件 发表日期：2016    内容类型：其他     已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择作者升序作者降序题名升序题名降序发表日期升序发表日期降序提交时间升序提交时间降序 Effects of various oxygen partial pressures on Ti-doped ZnO thin film transistors fabricated on flexible plastic substrate 其他 2016-01-01 Cui, Guodong; Han, Dedong; Yu, Wen; Shi, Pan; Zhang, Yi; Huang, Lingling; Cong, Yingying; Zhou, Xiaoliang; Zhang, Xiaomi; Zhang, Shengdong; Zhang, Xing; Wang, Yi 收藏  |  浏览/下载：5/0  |  提交时间：2017/12/03 AMORPHOUS OXIDE SEMICONDUCTORS  ROOM-TEMPERATURE  PERFORMANCE  DIELECTRICS   Deep Insights into Dielectric Breakdown in Tunnel FETs with Awareness of Reliability and Performance Co-Optimization 其他 2016-01-01 Huang, Qianqian; Jia, Rundong; Zhu, Jiadi; Lv, Zhu; Wang, Jiaxin; Chen, Cheng; Zhao, Yang; Wang, Runsheng; Bu, Weihai; Wang, Wenbo; Kang, Jin; Hua, Kelu; Wu, Hanming; Yu, Shaofeng; Wang, Yangyuan; Huang, Ru 收藏  |  浏览/下载：5/0  |  提交时间：2017/12/03 Insight into PBTI in InGaAs Nanowire FETs with Al2O3 and LaAlO3 Gate Dielectrics 其他 2016-01-01 Li, Y.; Di, S. Y.; Jiang, H.; Huang, P.; Wang, Y. J.; Lun, Z. Y.; Shen, L.; Yin, L. X.; Zhang, X.; Du, G.; Liu, X. Y. 收藏  |  浏览/下载：5/0  |  提交时间：2017/12/03 Theoretical Investigation on Hydrogen-related Oxide Traps in HfO_2 Gate Dielectrics: An ab-initio Study 其他 2016-01-01 Yawen Zhang; Peng Hao; Runsheng Wang; Jingwei Ji; Ru Huang 收藏  |  浏览/下载：6/0  |  提交时间：2017/12/03 defects  charging  Hydrogen  barriers  neighboring  likely  bounding  Atomic  interpolation  annealing  defects  charging  Hydrogen  barriers  neighboring  likely  bounding  Atomic  interpolation  annealing