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High temperature behavior of multi-region direct current current-voltage spectroscopy and relationship with shallow-trench-isolation-based high-voltage laterally diffused metal-oxide-semiconductor field-effect-transistors reliability 期刊论文
日本应用物理学杂志, 2014
He, Yandong; Zhang, Ganggang; Zhang, Xing
收藏  |  浏览/下载:3/0  |  提交时间:2015/11/10
High temperature behavior of multi-region direct current current-voltage spectroscopy and relationship with shallow-trench-isolation-based high-voltage laterally diffused metal-oxide-semiconductor field-effect-transistors reliability 其他
2014-01-01
He, Yandong; Zhang, Ganggang; Zhang, Xing
收藏  |  浏览/下载:5/0  |  提交时间:2017/12/03


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