Finite difference method for analyzing band structure in semiconductor heterostructures without spurious solutions

	Finite difference method for analyzing band structure in semiconductor heterostructures without spurious solutions
	Yu Jiang (江宇) ; Xunpeng Ma (马勋鹏) ; Yun Xu (徐云) ; Guofeng Song (宋国峰)
刊名	journal of applied physics
	2014
卷号	116 期号:17 页码:173702
学科主题	半导体物理 ; 半导体材料 ; 半导体器件 ; 光电子学
公开日期	2015-03-16
内容类型	期刊论文
源URL	[http://ir.semi.ac.cn/handle/172111/25953]
专题	半导体研究所_纳米光电子实验室
推荐引用方式 GB/T 7714	Yu Jiang ,Xunpeng Ma ,Yun Xu ,et al. Finite difference method for analyzing band structure in semiconductor heterostructures without spurious solutions[J]. journal of applied physics,2014,116(17):173702.
APA	Yu Jiang ,Xunpeng Ma ,Yun Xu ,&Guofeng Song .(2014).Finite difference method for analyzing band structure in semiconductor heterostructures without spurious solutions.journal of applied physics,116(17),173702.
MLA	Yu Jiang ,et al."Finite difference method for analyzing band structure in semiconductor heterostructures without spurious solutions".journal of applied physics 116.17(2014):173702.