The accurate method for removing misalignment errors from testing rectangular optics
Li Z. ; Wang X. K. ; Li S.
2013
会议名称2nd International Conference on Opto-Electronics Engineering and Materials Research, OEMR 2013, October 19, 2013 - October 20, 2013
会议地点Zhengzhou, Henan, China
页码219-222
英文摘要The limitations of current interferogram reduction software with Zernike polynomials in analyzing rectangular interferogram are illuminated. The Zernike polynomials are no longer orthogonal over an rectangular region and have no explicit physical meanings. The reasonable mathematical model for removing translation errors is established based on least squares fitting. The experiment is carried on with a 200mm75mm aspherical mirror by null-compensation, the misalignment errors can be eliminated from the original phase distribution exactly, thus the accurate surface map is gained, so it provides a guarantee for the superprecision fabrication. (2013) Trans Tech Publications, Switzerland.
收录类别EI
会议录2nd International Conference on Opto-Electronics Engineering and Materials Research, OEMR 2013, October 19, 2013 - October 20, 2013
会议录出版者Trans Tech Publications Ltd
会议录出版地Zhengzhou, Henan, China
内容类型会议论文
源URL[http://ir.ciomp.ac.cn/handle/181722/41001]  
专题长春光学精密机械与物理研究所_中科院长春光机所知识产出_会议论文
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Li Z.,Wang X. K.,Li S.. The accurate method for removing misalignment errors from testing rectangular optics[C]. 见:2nd International Conference on Opto-Electronics Engineering and Materials Research, OEMR 2013, October 19, 2013 - October 20, 2013. Zhengzhou, Henan, China.
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