The accurate method for removing misalignment errors from testing rectangular optics | |
Li Z. ; Wang X. K. ; Li S. | |
2013 | |
会议名称 | 2nd International Conference on Opto-Electronics Engineering and Materials Research, OEMR 2013, October 19, 2013 - October 20, 2013 |
会议地点 | Zhengzhou, Henan, China |
页码 | 219-222 |
英文摘要 | The limitations of current interferogram reduction software with Zernike polynomials in analyzing rectangular interferogram are illuminated. The Zernike polynomials are no longer orthogonal over an rectangular region and have no explicit physical meanings. The reasonable mathematical model for removing translation errors is established based on least squares fitting. The experiment is carried on with a 200mm75mm aspherical mirror by null-compensation, the misalignment errors can be eliminated from the original phase distribution exactly, thus the accurate surface map is gained, so it provides a guarantee for the superprecision fabrication. (2013) Trans Tech Publications, Switzerland. |
收录类别 | EI |
会议录 | 2nd International Conference on Opto-Electronics Engineering and Materials Research, OEMR 2013, October 19, 2013 - October 20, 2013 |
会议录出版者 | Trans Tech Publications Ltd |
会议录出版地 | Zhengzhou, Henan, China |
内容类型 | 会议论文 |
源URL | [http://ir.ciomp.ac.cn/handle/181722/41001] |
专题 | 长春光学精密机械与物理研究所_中科院长春光机所知识产出_会议论文 |
推荐引用方式 GB/T 7714 | Li Z.,Wang X. K.,Li S.. The accurate method for removing misalignment errors from testing rectangular optics[C]. 见:2nd International Conference on Opto-Electronics Engineering and Materials Research, OEMR 2013, October 19, 2013 - October 20, 2013. Zhengzhou, Henan, China. |
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