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Occurrence of cubic GaN and strain relaxation in GaN buffer layers grown by low-pressure metalorganic vapor phase epitaxy on (0001) sapphire substrates
Cheng, LS ; Zhou, K ; Zhang, Z ; Zhang, GY ; Yang, ZJ ; Tong, YZ
刊名APPLIED PHYSICS LETTERS
1999
卷号74期号:5页码:661
关键词DEPOSITION FILMS
ISSN号0003-6951
通讯作者Cheng, LS (reprint author), Chinese Acad Sci, Beijing Lab Electron Microscopy, Ctr Condensed Matter Phys, POB 2724, Beijing 100080, Peoples R China.
中文摘要Investigations on GaN buffer layers grown by low-pressure metalorganic vapor phase epitaxy on (0001) sapphire substrates indicated that the mechanisms by way of which GaN buffer layers relax stresses introduced by the lattice mismatch and thermal expansion coefficient difference between GaN epilayer and sapphire substrate are related to both the crystallographic structure of GaN and thickness of the buffer layers. Beside forming misfit dislocations, mismatch-induced stresses can also be relaxed by forming stacking faults and microtwin boundaries parallel to (11-1) of GaN near the interface between GaN and sapphire substrate in cubic GaN buffer layers. It was found that, in cubic GaN buffer layers, there exists a critical thickness within which the stacking faults and/or microtwin boundaries parallel to (11-1) of GaN can be formed. This critical value is determined to be 50 nm. (C) 1999 American Institute of Physics. [S0003-6951(99)02105-1].
收录类别SCI
语种英语
公开日期2013-09-24
内容类型期刊论文
源URL[http://ir.iphy.ac.cn/handle/311004/50201]  
专题物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文
推荐引用方式
GB/T 7714
Cheng, LS,Zhou, K,Zhang, Z,et al. Occurrence of cubic GaN and strain relaxation in GaN buffer layers grown by low-pressure metalorganic vapor phase epitaxy on (0001) sapphire substrates[J]. APPLIED PHYSICS LETTERS,1999,74(5):661.
APA Cheng, LS,Zhou, K,Zhang, Z,Zhang, GY,Yang, ZJ,&Tong, YZ.(1999).Occurrence of cubic GaN and strain relaxation in GaN buffer layers grown by low-pressure metalorganic vapor phase epitaxy on (0001) sapphire substrates.APPLIED PHYSICS LETTERS,74(5),661.
MLA Cheng, LS,et al."Occurrence of cubic GaN and strain relaxation in GaN buffer layers grown by low-pressure metalorganic vapor phase epitaxy on (0001) sapphire substrates".APPLIED PHYSICS LETTERS 74.5(1999):661.
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