Large-deformation analysis in microscopic area using micro-moire methods with a focused ion beam milling grating

CORC > 物理研究所 > 物理所公开发表论文 > 期刊论文

	Large-deformation analysis in microscopic area using micro-moire methods with a focused ion beam milling grating
	Du, H ; Xie, HM ; Guo, ZL ; Pan, B ; Luo, Q ; Gu, CZ ; Jiang, HC ; Rong, LJ
刊名	OPTICS AND LASERS IN ENGINEERING
	2007
卷号	45 期号:12 页码:1157
ISSN号	0143-8166
中文摘要	In this study, the focused ion beam (FIB) milling method is applied to fabricate sub-micron grating on TiNi shape memory alloy materials. With self-made FIB milling gratings, scanning electron microscope (SEM) micro-moire and digital moire methods are successfully used to measure large deformation of porous TiNi shape memory alloys (SMA) in uni-axial compressive tests. The principles of the SEM micro-moire method and digital moire method are introduced, and applied to calculate large strain. The full field deformation around shear bands can be measured precisely. During the investigation, the phenomenon of furcated moire fringes was found, and a corresponding explanation is given in this paper. The furcated fringes are generated in the locations of combined shear bands where sudden changes of strain occur. Successful results also verify that the FIB milling gratings are suitable for micro-moire measurement and can generate high quality moire fringes. (C) 2007 Elsevier Ltd. All rights reserved.
收录类别	SCI
公开日期	2013-09-18
内容类型	期刊论文
源URL	[http://ir.iphy.ac.cn/handle/311004/40654]
专题	物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文
推荐引用方式 GB/T 7714	Du, H,Xie, HM,Guo, ZL,et al. Large-deformation analysis in microscopic area using micro-moire methods with a focused ion beam milling grating[J]. OPTICS AND LASERS IN ENGINEERING,2007,45(12):1157.
APA	Du, H.,Xie, HM.,Guo, ZL.,Pan, B.,Luo, Q.,...&Rong, LJ.(2007).Large-deformation analysis in microscopic area using micro-moire methods with a focused ion beam milling grating.OPTICS AND LASERS IN ENGINEERING,45(12),1157.
MLA	Du, H,et al."Large-deformation analysis in microscopic area using micro-moire methods with a focused ion beam milling grating".OPTICS AND LASERS IN ENGINEERING 45.12(2007):1157.