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High photoexcited carrier multiplication by charged InAs dots in AlAs/GaAs/AlAs resonant tunneling diode
Wang, WP ; Hou, Y ; Xiong, DY ; Li, N ; Lu, W ; Wang, WX ; Chen, H ; Zhou, JM ; Wu, E ; Zeng, HP
刊名APPLIED PHYSICS LETTERS
2008
卷号92期号:2
ISSN号0003-6951
中文摘要We present an approach for the highly sensitive photon detection based on the quantum dots (QDs) operating at temperature of 77 K. The detection structure is based on an AlAs/GaAs/AlAs double barrier resonant tunneling diode combined with a layer of self-assembled InAs QDs (QD-RTD). A photon rate of 115 photons per second had induced 10 nA photocurrent in this structure, corresponding to the photoexcited carrier multiplication factor of 10(7). This high multiplication factor is achieved by the quantum dot induced memory effect and the resonant tunneling tuning effect of QD-RTD structure. (c) 2008 American Institute of Physics.
收录类别SCI
公开日期2013-09-17
内容类型期刊论文
源URL[http://ir.iphy.ac.cn/handle/311004/39199]  
专题物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文
推荐引用方式
GB/T 7714
Wang, WP,Hou, Y,Xiong, DY,et al. High photoexcited carrier multiplication by charged InAs dots in AlAs/GaAs/AlAs resonant tunneling diode[J]. APPLIED PHYSICS LETTERS,2008,92(2).
APA Wang, WP.,Hou, Y.,Xiong, DY.,Li, N.,Lu, W.,...&Zeng, HP.(2008).High photoexcited carrier multiplication by charged InAs dots in AlAs/GaAs/AlAs resonant tunneling diode.APPLIED PHYSICS LETTERS,92(2).
MLA Wang, WP,et al."High photoexcited carrier multiplication by charged InAs dots in AlAs/GaAs/AlAs resonant tunneling diode".APPLIED PHYSICS LETTERS 92.2(2008).
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