Interfacial defects in YBa2Cu3O7-/SrTiO3(001) heterostructures studied by aberration-corrected ultrahigh-resolution electron microscopy | |
S. B. Mi | |
刊名 | Philosophical Magazine Letters |
2013 | |
卷号 | 93期号:5页码:264-272 |
关键词 | thin films atomic-resolution electron microscopy interfacial structure cuprate superconductors defect structures ybco thin-films srtio3 substrate atomic-structure yba2cu3o7-delta growth superconductors |
ISSN号 | 0950-0839 |
原文出处 | |
语种 | 英语 |
公开日期 | 2013-12-24 |
内容类型 | 期刊论文 |
源URL | [http://ir.imr.ac.cn/handle/321006/71409] |
专题 | 金属研究所_中国科学院金属研究所 |
推荐引用方式 GB/T 7714 | S. B. Mi. Interfacial defects in YBa2Cu3O7-/SrTiO3(001) heterostructures studied by aberration-corrected ultrahigh-resolution electron microscopy[J]. Philosophical Magazine Letters,2013,93(5):264-272. |
APA | S. B. Mi.(2013).Interfacial defects in YBa2Cu3O7-/SrTiO3(001) heterostructures studied by aberration-corrected ultrahigh-resolution electron microscopy.Philosophical Magazine Letters,93(5),264-272. |
MLA | S. B. Mi."Interfacial defects in YBa2Cu3O7-/SrTiO3(001) heterostructures studied by aberration-corrected ultrahigh-resolution electron microscopy".Philosophical Magazine Letters 93.5(2013):264-272. |
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