Development and Characterization of Near-Isogenic Lines Derived from Synthetic Wheat Revealing the 2 kb Insertion in the PPD-D1 Gene Responsible for Heading Delay and Grain Number Improvement

	Development and Characterization of Near-Isogenic Lines Derived from Synthetic Wheat Revealing the 2 kb Insertion in the PPD-D1 Gene Responsible for Heading Delay and Grain Number Improvement
	Ning, Shunzong; Li, Shengke; Xu, Kai; Liu, Dongmei; Ma, Li; Ma, Chunfang; Hao, Ming; Zhang, Lianquan; Chen, Wenjie; Zhang, Bo
刊名	INTERNATIONAL JOURNAL OF MOLECULAR SCIENCES
	2023
卷号	24 期号:13
英文摘要	Spikelet number and grain number per spike are two crucial and correlated traits for grain yield in wheat. Photoperiod-1 (Ppd-1) is a key regulator of inflorescence architecture and spikelet formation in wheat. In this study, near-isogenic lines derived from the cross of a synthetic hexaploid wheat and commercial cultivars generated by double top-cross and two-phase selection were evaluated for the number of days to heading and other agronomic traits. The results showed that heading time segregation was conferred by a single incomplete dominant gene PPD-D1, and the 2 kb insertion in the promoter region was responsible for the delay in heading. Meanwhile, slightly delayed heading plants and later heading plants obviously have advantages in grain number and spikelet number of the main spike compared with early heading plants. Utilization of PPD-D1 photoperiod sensitivity phenotype as a potential means to increase wheat yield potential.
内容类型	期刊论文
源URL	[http://210.75.249.4/handle/363003/61619]
专题	西北高原生物研究所_中国科学院西北高原生物研究所
推荐引用方式 GB/T 7714	Ning, Shunzong,Li, Shengke,Xu, Kai,et al. Development and Characterization of Near-Isogenic Lines Derived from Synthetic Wheat Revealing the 2 kb Insertion in the PPD-D1 Gene Responsible for Heading Delay and Grain Number Improvement[J]. INTERNATIONAL JOURNAL OF MOLECULAR SCIENCES,2023,24(13).
APA	Ning, Shunzong.,Li, Shengke.,Xu, Kai.,Liu, Dongmei.,Ma, Li.,...&Liu, Dengcai.(2023).Development and Characterization of Near-Isogenic Lines Derived from Synthetic Wheat Revealing the 2 kb Insertion in the PPD-D1 Gene Responsible for Heading Delay and Grain Number Improvement.INTERNATIONAL JOURNAL OF MOLECULAR SCIENCES,24(13).
MLA	Ning, Shunzong,et al."Development and Characterization of Near-Isogenic Lines Derived from Synthetic Wheat Revealing the 2 kb Insertion in the PPD-D1 Gene Responsible for Heading Delay and Grain Number Improvement".INTERNATIONAL JOURNAL OF MOLECULAR SCIENCES 24.13(2023).