Single Event Burnout Hardening of Enhancement Mode HEMTs With Double Field Plates

	Single Event Burnout Hardening of Enhancement Mode HEMTs With Double Field Plates
	Zhen, Zixin; Feng, Chun; Wang, Quan; Niu, Di; Wang, Xiaoliang; Tan, Manqing
刊名	IEEE TRANSACTIONS ON NUCLEAR SCIENCE
	2021
卷号	68 期号:9 页码:2358-2366
语种	英语
公开日期	2021
内容类型	期刊论文
源URL	[http://ir.semi.ac.cn/handle/172111/30852]
专题	半导体研究所_中科院半导体材料科学重点实验室
推荐引用方式 GB/T 7714	Zhen, Zixin; Feng, Chun; Wang, Quan; Niu, Di; Wang, Xiaoliang; Tan, Manqing. Single Event Burnout Hardening of Enhancement Mode HEMTs With Double Field Plates[J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE,2021,68(9):2358-2366.
APA	Zhen, Zixin; Feng, Chun; Wang, Quan; Niu, Di; Wang, Xiaoliang; Tan, Manqing.(2021).Single Event Burnout Hardening of Enhancement Mode HEMTs With Double Field Plates.IEEE TRANSACTIONS ON NUCLEAR SCIENCE,68(9),2358-2366.
MLA	Zhen, Zixin; Feng, Chun; Wang, Quan; Niu, Di; Wang, Xiaoliang; Tan, Manqing."Single Event Burnout Hardening of Enhancement Mode HEMTs With Double Field Plates".IEEE TRANSACTIONS ON NUCLEAR SCIENCE 68.9(2021):2358-2366.