A Fast Surface Defect Detection Method Based on Background Reconstruction
Lv, Chengkan1,3; Zhang, Zhengtao1,2,3; Shen, Fei1,2,3; Zhang, Feng1,2,3; Su, Hu1,2,3
刊名INTERNATIONAL JOURNAL OF PRECISION ENGINEERING AND MANUFACTURING
2019-11-09
卷号21期号:3页码:363-375
关键词Defect detection Unsupervised learning Background reconstruction
ISSN号2234-7593
DOI10.1007/s12541-019-00262-2
英文摘要

In this paper, we propose an unsupervised background reconstruction method to detect defects on surfaces with unevenly distributed textures. An improved deep convolutional autoencoder is utilized to reconstruct the textured background of the original image as a defect-free reference. Specifically, a weighted loss function based on structural similarity (SSIM) is utilized to adapt to the unevenly distributed texture background and improve the reconstruction accuracy. Furthermore, combined with the reconstructed defect-free reference, a novel difference analysis method based on the discrete cosine transform (DCT) is given to accurately segment the defect regions from the original image. A series of experiments for the defect detection on mobile phone cover glass (MPCG) are conducted. The processing time for an image of 512 x 512 pixels is only 20 ms, which satisfies the requirement of online detection. The experimental results verify the effectiveness of the proposed method.

资助项目National Natural Science Foundation of China[61503378] ; Youth Innovation Promotion Association, CAS[2013097]
WOS关键词INSPECTION ; DEEP
WOS研究方向Engineering
语种英语
出版者KOREAN SOC PRECISION ENG
WOS记录号WOS:000495300100001
内容类型期刊论文
源URL[http://ir.ia.ac.cn/handle/173211/28884]  
专题精密感知与控制研究中心_精密感知与控制
通讯作者Shen, Fei
作者单位1.Univ Chinese Acad Sci, Beijing 100049, Peoples R China
2.CASI Vis Technol CO LTD, Luoyang 471000, Henan, Peoples R China
3.Chinese Acad Sci, Inst Automat, Res Ctr Precis Sensing & Control, Beijing 100190, Peoples R China
推荐引用方式
GB/T 7714
Lv, Chengkan,Zhang, Zhengtao,Shen, Fei,et al. A Fast Surface Defect Detection Method Based on Background Reconstruction[J]. INTERNATIONAL JOURNAL OF PRECISION ENGINEERING AND MANUFACTURING,2019,21(3):363-375.
APA Lv, Chengkan,Zhang, Zhengtao,Shen, Fei,Zhang, Feng,&Su, Hu.(2019).A Fast Surface Defect Detection Method Based on Background Reconstruction.INTERNATIONAL JOURNAL OF PRECISION ENGINEERING AND MANUFACTURING,21(3),363-375.
MLA Lv, Chengkan,et al."A Fast Surface Defect Detection Method Based on Background Reconstruction".INTERNATIONAL JOURNAL OF PRECISION ENGINEERING AND MANUFACTURING 21.3(2019):363-375.
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