Test-bench Design for New Beam Instrumentation Electronics at CERN

	Test-bench Design for New Beam Instrumentation Electronics at CERN
	M. Gonzalez-Berges; J.O. Robinson; M. Saccani; V. Schramm; M.A. Stachon
	2019
会议日期	2019
会议地点	New York
会议录	Proceedings of the 17th International Conference on Accelerator and Large Experimental Physics Control Systems
语种	英语
内容类型	会议论文
源URL	[http://ir.ihep.ac.cn/handle/311005/288828]
专题	学术会议_国际参会_JaCoW高能所参会会议_ICALEPCS
作者单位	CERN, Meyrin, Switzerland
推荐引用方式 GB/T 7714	M. Gonzalez-Berges,J.O. Robinson,M. Saccani,et al. Test-bench Design for New Beam Instrumentation Electronics at CERN[C]. 见:. New York. 2019.