Bloch Surface Wave Assisted Structured Illumination Microscopy for Sub-100 nm Resolution

doi:10.1109/JPHOT.2020.3044920

CORC > 光电技术研究所 > 中国科学院光电技术研究所 > 微细加工光学技术国家重点实验室（开放室）

	Bloch Surface Wave Assisted Structured Illumination Microscopy for Sub-100 nm Resolution
	Weijie Kong; Changtao Wang; Mingbo Pu; Xiaoliang Ma; Xiong Li; Xiangang Luo
刊名	IEEE Photonics Journal
	2020-12-17
卷号	13 期号:1 页码:4500109
关键词	Imaging , Lighting , Spatial resolution , Microscopy , Optical surface waves , Optical microscopy , Optical imaging
ISSN号	1943-0647
DOI	10.1109/JPHOT.2020.3044920
文献子类	期刊论文
英文摘要	Structured illumination microscopy (SIM) is one of the most powerful and versatile super-resolution methods due to its live-cell imaging ability of subcellular structures with high speed. In this paper, we propose an alternative SIM assisted by Bloch surface wave (BSW). Through replacing the conventional laser interference fringes with sub-diffraction BSW counterparts with higher spatial frequency, the imaging resolution of SIM could be enhanced greatly and the super-resolution imaging capability down to 80 nm could be achieved. Compared with traditional wide-field fluorescence microscopy, this BSW SIM demonstrates 2.78 times enhancement in imaging resolution, which surpasses general SIM with only 2 times improvement. Moreover, the structured illumination intensity could be boosted drastically, which is beneficial to nonlinear super-resolution imaging techniques, such as saturated SIM. This BSW SIM would provide a super-resolution, wide field of view approach for surface super-resolution fluorescent imaging while maintaining high imaging speed and good bio-compatibility.
语种	英语
内容类型	期刊论文
源URL	[http://ir.ioe.ac.cn/handle/181551/10152]
专题	光电技术研究所_微细加工光学技术国家重点实验室（开放室）
通讯作者	Xiangang Luo
作者单位	State Key Laboratory of Optical Technologies on Nano-Fabrication and Micro-Engineering, Institute of Optics and Electronics, Chinese Academy of Sciences, Chengdu, China School of Optoelectronics, University of Chinese Academy of Sciences, Beijing, China
推荐引用方式 GB/T 7714	Weijie Kong,Changtao Wang,Mingbo Pu,et al. Bloch Surface Wave Assisted Structured Illumination Microscopy for Sub-100 nm Resolution[J]. IEEE Photonics Journal,2020,13(1):4500109.
APA	Weijie Kong,Changtao Wang,Mingbo Pu,Xiaoliang Ma,Xiong Li,&Xiangang Luo.(2020).Bloch Surface Wave Assisted Structured Illumination Microscopy for Sub-100 nm Resolution.IEEE Photonics Journal,13(1),4500109.
MLA	Weijie Kong,et al."Bloch Surface Wave Assisted Structured Illumination Microscopy for Sub-100 nm Resolution".IEEE Photonics Journal 13.1(2020):4500109.