Technology life cycle analysis method based on patent documents

	Technology life cycle analysis method based on patent documents
	Xian Zhang(张娴); Xian Zhang(张娴); Xian Zhang(张娴)
刊名	technological forecasting & social change 80 (2013) 398–407
	2013
期号	80 页码:398-407
关键词	Technology life cycle Patent Indicator Cathode ray tube Thin film transistor liquid crystal display Nano-biosensor
学科主题	情报研究 ; 情报研究理论与方法
WOS记录号	WOS:000316510300003
公开日期	2013-09-15
内容类型	期刊论文
源URL	[http://ir.las.ac.cn/handle/12502/6268]
专题	文献情报中心_中国科学院成都文献情报中心_情报研究部
推荐引用方式 GB/T 7714	Xian Zhang,Xian Zhang,Xian Zhang. Technology life cycle analysis method based on patent documents[J]. technological forecasting & social change 80 (2013) 398–407,2013(80):398-407.
APA	Xian Zhang,Xian Zhang,&Xian Zhang.(2013).Technology life cycle analysis method based on patent documents.technological forecasting & social change 80 (2013) 398–407(80),398-407.
MLA	Xian Zhang,et al."Technology life cycle analysis method based on patent documents".technological forecasting & social change 80 (2013) 398–407 .80(2013):398-407.