Manufacture of semiconductor device
HASHIMOTO AKIHIRO; KOBAYASHI NOBUO; KAMIJO TAKESHI
1988-12-19
著作权人OKI ELECTRIC IND CO LTD
专利号JP1988310189A
国家日本
文献子类发明申请
其他题名Manufacture of semiconductor device
英文摘要PURPOSE:To eliminate the formation of a high resistance layer on a regrown boundary and the difficulty of a regrowth by disordering the superlattice structure of a superlattice structure clad layer except a stripe by heat treating by means of impurity diffusion from a current narrowing layer. CONSTITUTION:After a current narrowing layer is formed in a buried shape except a stripe on a substrate 1, a clad layer 4, an active layer 5, a clad layer 6 and a cap layer 7 of a superlattice structure are sequentially grown on the substrate Then, the superlattice structure of the layer 4 is then disordered by heat treating except the stripe by means of an impurity diffusion from the narrowing layer. Accordingly, the step of regrowing on a crystal layer having high mixed crystal ratio of exposed aluminum is eliminated. Thus, a high resistance layer is not formed on a regrown boundary and the difficulty of regrowth is eliminated.
公开日期1988-12-19
申请日期1987-06-12
状态失效
内容类型专利
源URL[http://ir.opt.ac.cn/handle/181661/88135]  
专题半导体激光器专利数据库
作者单位OKI ELECTRIC IND CO LTD
推荐引用方式
GB/T 7714
HASHIMOTO AKIHIRO,KOBAYASHI NOBUO,KAMIJO TAKESHI. Manufacture of semiconductor device. JP1988310189A. 1988-12-19.
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