Manufacture of semiconductor device | |
HASHIMOTO AKIHIRO; KOBAYASHI NOBUO; KAMIJO TAKESHI | |
1988-12-19 | |
著作权人 | OKI ELECTRIC IND CO LTD |
专利号 | JP1988310189A |
国家 | 日本 |
文献子类 | 发明申请 |
其他题名 | Manufacture of semiconductor device |
英文摘要 | PURPOSE:To eliminate the formation of a high resistance layer on a regrown boundary and the difficulty of a regrowth by disordering the superlattice structure of a superlattice structure clad layer except a stripe by heat treating by means of impurity diffusion from a current narrowing layer. CONSTITUTION:After a current narrowing layer is formed in a buried shape except a stripe on a substrate 1, a clad layer 4, an active layer 5, a clad layer 6 and a cap layer 7 of a superlattice structure are sequentially grown on the substrate Then, the superlattice structure of the layer 4 is then disordered by heat treating except the stripe by means of an impurity diffusion from the narrowing layer. Accordingly, the step of regrowing on a crystal layer having high mixed crystal ratio of exposed aluminum is eliminated. Thus, a high resistance layer is not formed on a regrown boundary and the difficulty of regrowth is eliminated. |
公开日期 | 1988-12-19 |
申请日期 | 1987-06-12 |
状态 | 失效 |
内容类型 | 专利 |
源URL | [http://ir.opt.ac.cn/handle/181661/88135] |
专题 | 半导体激光器专利数据库 |
作者单位 | OKI ELECTRIC IND CO LTD |
推荐引用方式 GB/T 7714 | HASHIMOTO AKIHIRO,KOBAYASHI NOBUO,KAMIJO TAKESHI. Manufacture of semiconductor device. JP1988310189A. 1988-12-19. |
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