Target detection method for small defects in ink area of planar glass element
Qi, Wenbo; Wang, Zhengzhou; Wang, Li; Tan, Meng; Wei, Jitong
2019
会议日期2019-07-07
会议地点Beijing, China
关键词Planar glass element Ink area small and weak defect target target detection self-correlation template matching one-dimensional maximum entropy
卷号11342
DOI10.1117/12.2542893
其他题名Qi, Wenbo(1); Wang, Zhengzhou(1); Wang, Li(1); Tan, Meng(1); Wei, Jitong(1)
英文摘要

In the detection of small and weak defect targets in ink area of planar glass element of a mobile phone, using linear array camera with dark field illumination and line-by-line scanning imaging system will result in the size of image (30720 ∗16384) much larger than the size of small defect targets (3 pixels). At the same time, because the stains are located in the ink area, the contrast between the defect target and the background of the ink area could be very low. This will lead to the weak defect targets in the ink area could not be detected quickly and effectively using the common target detection method. In order to solve this problem, a detection method of small and weak defects in the ink area of planar glass element based on self-correlation template matching and one-dimensional maximum entropy is proposed in this paper. Firstly, the large-scale image is first clipped, and the character information in the ink area is recognized and fixed position using the self-correlation template matching algorithm. The character and Logo information in the ink area are clipped according to the positioning results. Secondly, the processed image is clipped twice and binarized by the OTSU method. BLOB technology is used to select the largest white area as the ink area in the second clipping image. Thirdly, Sobel operator is used to detect the edge of the ink area, and the transitional area with the width of 100 pixels on the edge of the ink area is clipped, so the clipping image of the ink area which only contained valid small and weak defect targets is obtained. Finally, One-dimensional maximum entropy algorithm is used to separate the defect targets from real ink area, and the weak and small defect targets are recognized and detected by BLOB technology. The experimental results show that the method solves the problem of detecting the small and weak defects in the ink area of the planar glass element with fast recognition speed and high detection accuracy. It can be applied in the process of detecting the quality and cleanliness of planar glass element, and has great significance for improving the quality and efficiency of mobile phone production and assembly. © 2019 SPIE.

产权排序1
会议录AOPC 2019: AI in Optics and Photonics
会议录出版者SPIE
语种英语
ISSN号0277786X;1996756X
WOS记录号WOS:000525823200006
内容类型会议论文
源URL[http://ir.opt.ac.cn/handle/181661/93185]  
专题西安光学精密机械研究所_先进光学仪器研究室
作者单位Xi'an Institute of Optics and Precision Mechanics, Chinese Academy of Science, Xi'an; 710119, China
推荐引用方式
GB/T 7714
Qi, Wenbo,Wang, Zhengzhou,Wang, Li,et al. Target detection method for small defects in ink area of planar glass element[C]. 见:. Beijing, China. 2019-07-07.
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