Diagnosis and Prognosis of Degradation Process via Hidden Semi-Markov Model | |
Liu, Tongshun3; Zhu, Kunpeng2; Zeng, Liangcai1 | |
刊名 | IEEE-ASME TRANSACTIONS ON MECHATRONICS |
2018-06-01 | |
卷号 | 23期号:3页码:1456-1466 |
关键词 | Degradation process forward-backward algorithm health monitoring Hidden semi-Markov remaining useful life (RUL) |
ISSN号 | 1083-4435 |
DOI | 10.1109/TMECH.2018.2823320 |
英文摘要 | The intelligent estimation of degradation state and the prediction of remaining useful life (RUL) are important for the maintenance of industrial equipment. In this study, the degradation process of equipment is modeled as an improved hidden semi-Markov model (HSMM), in which the dependence of durations of adjacent degradation states is described and modeled in the HSMM. To avoid underflow problem in computing the forward and backward variables, a modified forward-backward algorithm is proposed in the HSMM. Based on the improved algorithm, online estimation of degradation state and the distribution of RUL can be obtained. Case studies on tool wearing diagnosis and prognosis have verified the effectiveness of this model. |
资助项目 | National Natural Science Foundation of China[51475443] ; CAS 100 Talents Program, Chinese Academy of Sciences |
WOS关键词 | MILLING TOOL WEAR ; MACHINING PROCESSES ; FAULT-DIAGNOSIS ; PREDICTION ; ALGORITHM |
WOS研究方向 | Automation & Control Systems ; Engineering |
语种 | 英语 |
出版者 | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC |
WOS记录号 | WOS:000435338300045 |
内容类型 | 期刊论文 |
源URL | [http://ir.hfcas.ac.cn:8080/handle/334002/38240] |
专题 | 合肥物质科学研究院_中科院合肥物质科学研究院先进制造技术研究所 |
通讯作者 | Zhu, Kunpeng |
作者单位 | 1.Wuhan Univ Sci & Technol, Sch Machinery & Automat, Wuhan 430081, Hubei, Peoples R China 2.Chinese Acad Sci, Hefei Inst Phys Sci, Inst Adv Mfg Technol, Changzhou 213164, Peoples R China 3.Univ Sci & Technol China, Dept Automat, Hefei 230026, Anhui, Peoples R China |
推荐引用方式 GB/T 7714 | Liu, Tongshun,Zhu, Kunpeng,Zeng, Liangcai. Diagnosis and Prognosis of Degradation Process via Hidden Semi-Markov Model[J]. IEEE-ASME TRANSACTIONS ON MECHATRONICS,2018,23(3):1456-1466. |
APA | Liu, Tongshun,Zhu, Kunpeng,&Zeng, Liangcai.(2018).Diagnosis and Prognosis of Degradation Process via Hidden Semi-Markov Model.IEEE-ASME TRANSACTIONS ON MECHATRONICS,23(3),1456-1466. |
MLA | Liu, Tongshun,et al."Diagnosis and Prognosis of Degradation Process via Hidden Semi-Markov Model".IEEE-ASME TRANSACTIONS ON MECHATRONICS 23.3(2018):1456-1466. |
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