Design, RF measurement, tuning, and high-power test of an X-band deflector for Soft X-ray Free Electron Lasers (SXFEL) at SINAP

doi:10.1016/j.nima.2019.03.093

CORC > 上海应用物理研究所 > 中国科学院上海应用物理研究所 > 中科院上海应用物理研究所2011-2017年

	Design, RF measurement, tuning, and high-power test of an X-band deflector for Soft X-ray Free Electron Lasers (SXFEL) at SINAP
	Tan, JH ; Fang, WC ; Tong, DC ; Gu, Q ; Huang, XX ; Li, ZB ; Higo, T ; Matsumoto, S ; Takatomi, T ; Zhao, ZT
刊名	NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT
	2019
卷号	930 期号:-页码:210—219
ISSN号	0168-9002
DOI	10.1016/j.nima.2019.03.093
文献子类	期刊论文
英文摘要	An X-band transverse-deflecting structure is a crucial RF unit for bunch-length measurement conducted at the Shanghai Soft-X-ray Free Electron Laser Facility (SXFEL) at the Shanghai Institute of Applied Physics (SINAP), Chinese Academy of Sciences. The target of this prototype deflector is to operate at 30 MW to have a deflection of 10 MV/structure to realize 20-fs resolution in a full-size structure (0.6 meters long, used on user facility of SXFEL), which satisfies the requirement of the linac beam size measurement at 840 MeV. The program was started in 2010 focusing on X-band deflectors, including design, fabrication, and RF measurement. The electrical tuning of the deflector was successfully done using a unique "cage"-type bead. Recently, a high-power test was conducted at KEK on the first prototype deflector. The high-gradient features at the nominal gradient was proven, but the further increase of power and pulse width was limited at 45 MW with a 173-ns pulse width due to approaching the feasible limit of the modified pointing vector value 5 MW/mm(2). In this final stage, frequent breakdowns near the badly brazed point occurred and further conditioning had to be suspended owing to limited available time.
语种	英语
内容类型	期刊论文
源URL	[http://ir.sinap.ac.cn/handle/331007/31546]
专题	上海应用物理研究所_中科院上海应用物理研究所2011-2017年
作者单位	1.Chinese Acad Sci, Shanghai Sci Res Ctr, Shanghai 201204, Peoples R China; 2.High Energy Accelerator Res Org KEK, Tsukuba, Ibaraki, Japan; 3.Grad Univ Adv Studies, Hayama, Kanagawa, Japan 4.Chinese Acad Sci, Shanghai Inst Appl Phys, Shanghai 201800, Peoples R China; 5.Tsinghua Univ, Dept Engn Phys, Beijing 100084, Peoples R China; 6.Chinese Acad Sci, Dalian Inst Chem Phys, Dalian 116023, Peoples R China;
推荐引用方式 GB/T 7714	Tan, JH,Fang, WC,Tong, DC,et al. Design, RF measurement, tuning, and high-power test of an X-band deflector for Soft X-ray Free Electron Lasers (SXFEL) at SINAP[J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT,2019,930(-):210—219.
APA	Tan, JH.,Fang, WC.,Tong, DC.,Gu, Q.,Huang, XX.,...&Zhao, ZT.(2019).Design, RF measurement, tuning, and high-power test of an X-band deflector for Soft X-ray Free Electron Lasers (SXFEL) at SINAP.NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT,930(-),210—219.
MLA	Tan, JH,et al."Design, RF measurement, tuning, and high-power test of an X-band deflector for Soft X-ray Free Electron Lasers (SXFEL) at SINAP".NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT 930.-(2019):210—219.