Fully Coupled Electrothermal Simulation of Large RRAM Arrays in the "Thermal-House''
Wang, Da-Wei; Chen, Wenchao; Zhao, Wen-Sheng; Zhu, Guo-Dong; Kang, Kai; Gao, Pingqi; Schutt-Aine, Jose E.; Yin, Wen-Yan
刊名IEEE ACCESS
2019
卷号7页码:3897-3908
关键词RANDOM-ACCESS MEMORY RESISTIVE MEMORY INTEGRATION BEHAVIOR DIAMOND ZN4SB3 MODEL
DOI10.1109/ACCESS.2018.2888572
英文摘要Fully Coupled Electrothermal Simulation of Large RRAM Arrays in the "Thermal-House''
内容类型期刊论文
源URL[http://ir.nimte.ac.cn/handle/174433/18820]  
专题2019专题
作者单位1.Zhao, WS (reprint author), Hangzhou Dianzi Univ, Sch Elect & Informat, Hangzhou 310018, Zhejiang, Peoples R China.
2.Chen, WC (reprint author), Zhejiang Univ, ZJU LTIUC Inst, Int Campus, Haining 314400, Peoples R China.
3.Yin, WY (reprint author), Zhejiang Univ, Innovat Inst Electromagnet Informat & Elect Integ, Coll Informat Sci & Elect Engn, Key Lab Adv Micronano Elect Devices & Smart Syst, Hangzhou 310058, Zhejiang, Peoples R China.
4.Chen, WC
推荐引用方式
GB/T 7714
Wang, Da-Wei,Chen, Wenchao,Zhao, Wen-Sheng,et al. Fully Coupled Electrothermal Simulation of Large RRAM Arrays in the "Thermal-House''[J]. IEEE ACCESS,2019,7:3897-3908.
APA Wang, Da-Wei.,Chen, Wenchao.,Zhao, Wen-Sheng.,Zhu, Guo-Dong.,Kang, Kai.,...&Yin, Wen-Yan.(2019).Fully Coupled Electrothermal Simulation of Large RRAM Arrays in the "Thermal-House''.IEEE ACCESS,7,3897-3908.
MLA Wang, Da-Wei,et al."Fully Coupled Electrothermal Simulation of Large RRAM Arrays in the "Thermal-House''".IEEE ACCESS 7(2019):3897-3908.
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