半導体レーザ | |
日野 功 | |
1998-03-13 | |
著作权人 | 日本電気株式会社 |
专利号 | JP2758598B2 |
国家 | 日本 |
文献子类 | 授权发明 |
其他题名 | 半導体レーザ |
英文摘要 | PURPOSE:To prevent the deterioration of ends due to photoabsorption and the damage to the ends from occurring by a method wherein a multilayered structure including an active layer is provided; a ternary or higher III-V compound mixed crystal in different coupling length between group III atoms and group V atoms in the crystal is used as the active layer; and the carrier concentration in the active layer near the ends to be the reflecting surface or the outgoing surface is specified. CONSTITUTION:An n-type (Al0.4Ga0.6)0.5In0.5P clad layer 2, a Ga0.5 In0.5P active layer 3, a p type (Al0.4Ga0.6)In0.5P clad layer 4 and a p type GaAs cap layer 9 are successively grown on an n-type GaAs substrate 1 by the MOVPE process. The active layer 3 is grown meeting the requirements of temperature at 650 deg.C and V/III ratio without doping 400 impurity. Zn as p-type impurity is diffused in the part near the edge face 8 to provide the active layer part at least near the edge face 8 with the carrier concentration of 5X10cm. In such a constitution, a Zn diffused region 5 near the ends 8 is limited to the range of around 20mum inside the edge face 8 which are made by cleavage process. |
公开日期 | 1998-05-28 |
申请日期 | 1987-07-08 |
状态 | 失效 |
内容类型 | 专利 |
源URL | [http://ir.opt.ac.cn/handle/181661/76672] ![]() |
专题 | 半导体激光器专利数据库 |
作者单位 | 日本電気株式会社 |
推荐引用方式 GB/T 7714 | 日野 功. 半導体レーザ. JP2758598B2. 1998-03-13. |
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