Method of zinc oxide film grown on the epitaxial lateral overgrowth gallium nitride template
CHUA, SOON JIN; ZHOU, HAILONG; LIN, JIANYI; PAN, HUI
2011-05-31
著作权人NATIONAL UNIVERSITY OF SINGAPORE
专利号US7951639
国家美国
文献子类授权发明
其他题名Method of zinc oxide film grown on the epitaxial lateral overgrowth gallium nitride template
英文摘要A growth method is proposed for high quality zinc oxide comprising the following steps: (1) growing a gallium nitride layer on a sapphire substrate around a temperature of 1000° C.; (2) patterning a SiO2 mask into stripes oriented in the gallium nitride <1 100> or <11 20> direction; (3) growing epitaxial lateral overgrowth of (ELO) gallium nitride layers by controlling the facet planes via choosing the growth temperature and the reactor; (4) depositing zinc oxide films on facets ELO gallium nitride templates by chemical vapor deposition (CVD). Zinc oxide crystal of high quality with a reduced number of crystal defects can be grown on a gallium nitride template. This method can be used to fabricate zinc oxide films with low dislocation density lower than 104/cm−2, which will find important applications in future electronic and optoelectronic devices.
公开日期2011-05-31
申请日期2008-10-24
状态授权
内容类型专利
源URL[http://ir.opt.ac.cn/handle/181661/73725]  
专题半导体激光器专利数据库
作者单位NATIONAL UNIVERSITY OF SINGAPORE
推荐引用方式
GB/T 7714
CHUA, SOON JIN,ZHOU, HAILONG,LIN, JIANYI,et al. Method of zinc oxide film grown on the epitaxial lateral overgrowth gallium nitride template. US7951639. 2011-05-31.
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