Light source apparatus for measurement | |
WAKANA SHINICHI; FURUKAWA YASUO | |
1987-11-16 | |
著作权人 | FUJITSU LTD |
专利号 | JP1987263684A |
国家 | 日本 |
文献子类 | 发明申请 |
其他题名 | Light source apparatus for measurement |
英文摘要 | PURPOSE:To make it possible to correct the dispersion of oscillation frequency difference between two semiconductor laser elements, by a method wherein two semiconductor elements arranged on a heat sink with temperature gradient are used as a laser light source, and the temperature gradient is produced also between the two elements. CONSTITUTION:Semiconductor laser elements 1 and 2 having different oscillation frequencies are used, whose injection current can be controlled by a current controlling part 3. Further, the elements 1 and 2 are arranged along a temperature gradient on a heat sink 4 on which the temperature gradient is produced. This temperature gradient is produced from both ends of the heat sink 4 as the result of a specific temperature control applying a temperature controlling part 5. As the temperature gradient of the heat sink 4 can be controlled by the temperature controlling part 5, the temperature gradient can be produced also between the two semiconductor laser elements 1 and 2. Thereby, a desired frequency difference ¦f1-f2¦ can be obtained in response to the temperature gradient rather simply and exactly. |
公开日期 | 1987-11-16 |
申请日期 | 1986-05-10 |
状态 | 失效 |
内容类型 | 专利 |
源URL | [http://ir.opt.ac.cn/handle/181661/63026] ![]() |
专题 | 半导体激光器专利数据库 |
作者单位 | FUJITSU LTD |
推荐引用方式 GB/T 7714 | WAKANA SHINICHI,FURUKAWA YASUO. Light source apparatus for measurement. JP1987263684A. 1987-11-16. |
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