Light source apparatus for measurement
WAKANA SHINICHI; FURUKAWA YASUO
1987-11-16
著作权人FUJITSU LTD
专利号JP1987263684A
国家日本
文献子类发明申请
其他题名Light source apparatus for measurement
英文摘要PURPOSE:To make it possible to correct the dispersion of oscillation frequency difference between two semiconductor laser elements, by a method wherein two semiconductor elements arranged on a heat sink with temperature gradient are used as a laser light source, and the temperature gradient is produced also between the two elements. CONSTITUTION:Semiconductor laser elements 1 and 2 having different oscillation frequencies are used, whose injection current can be controlled by a current controlling part 3. Further, the elements 1 and 2 are arranged along a temperature gradient on a heat sink 4 on which the temperature gradient is produced. This temperature gradient is produced from both ends of the heat sink 4 as the result of a specific temperature control applying a temperature controlling part 5. As the temperature gradient of the heat sink 4 can be controlled by the temperature controlling part 5, the temperature gradient can be produced also between the two semiconductor laser elements 1 and 2. Thereby, a desired frequency difference ¦f1-f2¦ can be obtained in response to the temperature gradient rather simply and exactly.
公开日期1987-11-16
申请日期1986-05-10
状态失效
内容类型专利
源URL[http://ir.opt.ac.cn/handle/181661/63026]  
专题半导体激光器专利数据库
作者单位FUJITSU LTD
推荐引用方式
GB/T 7714
WAKANA SHINICHI,FURUKAWA YASUO. Light source apparatus for measurement. JP1987263684A. 1987-11-16.
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