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	Optical measurement analysis device, storage room, electromagnetic-wave generating device, and optical measurement analysis method
	MATSUDA, KYOKO; OKUMURA, TOSHIYUKI
	2013-01-10
著作权人	SHARP KABUSHIKI KAISHA
专利号	US20130010294A1
国家	美国
文献子类	发明申请
其他题名	Optical measurement analysis device, storage room, electromagnetic-wave generating device, and optical measurement analysis method
英文摘要	There is provided an optical measurement analysis device capable of applying light to substantially the entire surface of a to-be-analyzed object for improving the analysis accuracy. The optical measurement analysis device according to the present embodiment includes a container, a light source, a light irradiation unit, a light reception unit, a spectroscope unit, and an analyzing unit for analyzing an optical spectrum obtained by the spectroscope unit. The container has an inner wall adapted to reflect light reflected by the to-be-analyzed object and light transmitted therethrough.
公开日期	2013-01-10
申请日期	2012-06-22
状态	失效
内容类型	专利
源URL	[http://ir.opt.ac.cn/handle/181661/62545]
专题	半导体激光器专利数据库
作者单位	SHARP KABUSHIKI KAISHA
推荐引用方式 GB/T 7714	MATSUDA, KYOKO,OKUMURA, TOSHIYUKI. Optical measurement analysis device, storage room, electromagnetic-wave generating device, and optical measurement analysis method. US20130010294A1. 2013-01-10.

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