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	Arrayed sensor measurement system and method
	CARACCI, STEPHEN J.; FONTAINE, NORMAN H.; MOZDY, ERIC J.; YUEN, PO KI
	2005-05-12
著作权人	CORNING INCORPORATED
专利号	US20050099622A1
国家	美国
文献子类	发明申请
其他题名	Arrayed sensor measurement system and method
英文摘要	Optical interrogation systems and methods are described herein that are capable of measuring the angles (or changes in the angles) at which light reflects, transmits, scatters, or is emitted from an array of sensors or specimens that are distributed over a large area 2-dimensional array. In one embodiment of the present invention, the optical interrogation system has a far-field diffraction measurement configuration so it can simultaneously receive the light from sensors in all or a sub-section of a sensor array at a detector. In another embodiment of the present invention, the optical interrogation system incorporates an anamorphic optical receive system that enables parallel detection of angular responses from the sensors in the 2D array. In yet another embodiment of the present invention, the optical interrogation system incorporates an angular measurement system which measures the change in angular tilt of the sensor plane when the sensor array is moved or removed and then replaced in the measurement system. Several other embodiments of optical interrogation systems and methods are also described herein. A significant advantage of the present invention is that the system has no critical moving or scanning parts, which are frequently the source of measurement sensitivity limitations.
公开日期	2005-05-12
申请日期	2004-12-21
状态	失效
内容类型	专利
源URL	[http://ir.opt.ac.cn/handle/181661/62497]
专题	半导体激光器专利数据库
作者单位	CORNING INCORPORATED
推荐引用方式 GB/T 7714	CARACCI, STEPHEN J.,FONTAINE, NORMAN H.,MOZDY, ERIC J.,et al. Arrayed sensor measurement system and method. US20050099622A1. 2005-05-12.

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