A 1Gb/s silicon photo-receiver in standard CMOS for 850-nm optical communication
Huang BJ (Huang Beiju) ; Zhang X (Zhang Xu) ; Liu HJ (Liu Haijun) ; Liu JB (Liu, Jinbin) ; Dai XG (Dai Xiaoguang) ; Zhang Y (Zhang Yu) ; Chen HD (Chen Hongda)
2007
会议名称international workshop on electron devices and semiconductor technology
会议日期jun 03-04, 2007
会议地点beijing, peoples r china
关键词complementary metal-oxide-semiconductor (CMOS)
页码198-201
通讯作者huang, bj, chinese acad sci, inst semicond, state key lab integrated optoelect, beijing 100083, peoples r china.
中文摘要a monolithic silicon cmos optoelectronic integrated circuit (oeic) was designed and fabricated with standard 0.6 mu m cmos technology. this oeic circuit consisted of an integrated double photodiode detector (dpd) and a preamplifier. the dpd detector exhibited high bandwidth by screening the bulk-generated diffusion carriers and suppressing the slow diffusion tail effect. the preamplifier exploited the regulated cascode (rgc) configuration as the input stage of receiver, thus isolating the influence of photodiode capacitance and input parasitic capacitance on bandwidth. testing results showed that the bandwidth of oeic was 700mhz, indicating the bit rate of 1gb/s was achieved.
英文摘要a monolithic silicon cmos optoelectronic integrated circuit (oeic) was designed and fabricated with standard 0.6 mu m cmos technology. this oeic circuit consisted of an integrated double photodiode detector (dpd) and a preamplifier. the dpd detector exhibited high bandwidth by screening the bulk-generated diffusion carriers and suppressing the slow diffusion tail effect. the preamplifier exploited the regulated cascode (rgc) configuration as the input stage of receiver, thus isolating the influence of photodiode capacitance and input parasitic capacitance on bandwidth. testing results showed that the bandwidth of oeic was 700mhz, indicating the bit rate of 1gb/s was achieved.; zhangdi于2010-03-29批量导入; zhangdi于2010-03-29批量导入; ieee electron devices soc. tsinghua univ; chinese acad sci, inst semicond, state key lab integrated optoelect, beijing 100083, peoples r china
收录类别其他
会议主办者ieee electron devices soc. tsinghua univ
会议录2007 international workshop on electron devices and semiconductor technology
会议录出版者ieee ; 345 e 47th st, new york, ny 10017 usa
会议录出版地345 e 47th st, new york, ny 10017 usa
学科主题光电子学
语种英语
ISBN号978-1-4244-1097-2
内容类型会议论文
源URL[http://ir.semi.ac.cn/handle/172111/9830]  
专题半导体研究所_中国科学院半导体研究所(2009年前)
推荐引用方式
GB/T 7714
Huang BJ ,Zhang X ,Liu HJ ,et al. A 1Gb/s silicon photo-receiver in standard CMOS for 850-nm optical communication[C]. 见:international workshop on electron devices and semiconductor technology. beijing, peoples r china. jun 03-04, 2007.
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