Heteroepitaxial Growth of 3C-SiC on Si (111) Substrate using AlN as a Buffer Layer | |
Zhao, YM ; Sun, GS ; Liu, XF ; Li, JY ; Zhao, WS ; Wang, L ; Li, JM ; Zeng, YP | |
2009 | |
会议名称 | international conference on silicon carbide and related materials |
会议日期 | oct 14-19, 2007 |
会议地点 | otsu, japan |
关键词 | Silicon Carbide Aluminum Nitride buffer layer LPCVD |
页码 | pts 1 and 2,600-603,: 251-254 part 1-2 |
通讯作者 | zhao, ym, chinese acad sci, inst semicond, novel semicond mat lab, beijing 100083, peoples r china. |
中文摘要 | using aln as a buffer layer, 3c-sic film has been grown on si substrate by low pressure chemical vapor deposition (lpcvd). firstly growth of aln thin films on si substrates under varied v/iii ratios at 1100 degrees was investigated and the (002) preferred orientational growth with good crystallinity was obtained at the v/iii ratio of 10000. annealing at 1300 degrees c indicated the surface morphology and crystallinity stability of aln film. secondly the 3c-sic film was grown on si substrate with aln buffer layer. compared to that without aln buffer layer, the crystal quality of the 3c-sic film was improved on the aln/si substrate, characterized by x-ray diffraction (xrd) and raman measurements. |
英文摘要 | using aln as a buffer layer, 3c-sic film has been grown on si substrate by low pressure chemical vapor deposition (lpcvd). firstly growth of aln thin films on si substrates under varied v/iii ratios at 1100 degrees was investigated and the (002) preferred orientational growth with good crystallinity was obtained at the v/iii ratio of 10000. annealing at 1300 degrees c indicated the surface morphology and crystallinity stability of aln film. secondly the 3c-sic film was grown on si substrate with aln buffer layer. compared to that without aln buffer layer, the crystal quality of the 3c-sic film was improved on the aln/si substrate, characterized by x-ray diffraction (xrd) and raman measurements.; zhangdi于2010-03-09批量导入; made available in dspace on 2010-03-09t07:08:19z (gmt). no. of bitstreams: 1 305.pdf: 252141 bytes, checksum: 4d95b3f2dc7121752d6a95a52cef5d83 (md5) previous issue date: 2009; japan soc appl phys.; assoc promot elect, elect & informat engn.; ceram soc japan.; ieee eds, kansai chapter.; ieej.; inst elect, informat & commun engineers.; japanese assoc crystal growth.; surface sci soc japan.; vacuum soc japan.; [zhao, y. m.; sun, g. s.; liu, x. f.; li, j. y.; zhao, w. s.; wang, l.; li, j. m.; zeng, y. p.] chinese acad sci, inst semicond, novel semicond mat lab, beijing 100083, peoples r china |
收录类别 | CPCI-S |
会议主办者 | japan soc appl phys.; assoc promot elect, elect & informat engn.; ceram soc japan.; ieee eds, kansai chapter.; ieej.; inst elect, informat & commun engineers.; japanese assoc crystal growth.; surface sci soc japan.; vacuum soc japan. |
会议录 | silicon carbide and related materials 2007 |
会议录出版者 | trans tech publications ltd ; laublsrutistr 24, ch-8717 stafa-zurich, switzerland |
会议录出版地 | laublsrutistr 24, ch-8717 stafa-zurich, switzerland |
学科主题 | 半导体材料 |
语种 | 英语 |
ISSN号 | 0255-5476 |
内容类型 | 会议论文 |
源URL | [http://ir.semi.ac.cn/handle/172111/8336] |
专题 | 半导体研究所_中国科学院半导体研究所(2009年前) |
推荐引用方式 GB/T 7714 | Zhao, YM,Sun, GS,Liu, XF,et al. Heteroepitaxial Growth of 3C-SiC on Si (111) Substrate using AlN as a Buffer Layer[C]. 见:international conference on silicon carbide and related materials. otsu, japan. oct 14-19, 2007. |
个性服务 |
查看访问统计 |
相关权益政策 |
暂无数据 |
收藏/分享 |
除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。
修改评论