Simulation of single electronic device and robust circuit construction

CORC > 半导体研究所 > 中国科学院半导体研究所 > 中国科学院半导体研究所（2009年前）

	Simulation of single electronic device and robust circuit construction
	Zhou, KD ; Lu, HX
	2007
会议名称	ieee international conference on control and automation
会议日期	may 30-jun 01, 2007
会议地点	guangzhou, peoples r china
关键词	single electronic device neural network
页码	vols 1-7: 2703-2705
通讯作者	zhou, kd, chinese acad sci, inst semicond, lab artificial neural networks, beijing 100864, peoples r china.
中文摘要	the article mainly focuses on the simulation of the single electron device and circuit. the orthodox model of single electronic device is introduced and the simulation with matlab and pspice is illustrated in the article. moreover, the built of robust circuit using single electronic according to neural network is done and the simulation is also included in the paper. the result shows that neural network added with proper redundancy is an available candidate for single electron device circuit. the proposed structure is also promising for the realization of low ultra-low power consumption and solution of transient device failure.
英文摘要	the article mainly focuses on the simulation of the single electron device and circuit. the orthodox model of single electronic device is introduced and the simulation with matlab and pspice is illustrated in the article. moreover, the built of robust circuit using single electronic according to neural network is done and the simulation is also included in the paper. the result shows that neural network added with proper redundancy is an available candidate for single electron device circuit. the proposed structure is also promising for the realization of low ultra-low power consumption and solution of transient device failure.; zhangdi于2010-03-09批量导入; made available in dspace on 2010-03-09t02:11:52z (gmt). no. of bitstreams: 1 657.pdf: 904353 bytes, checksum: e04374b43d052af24979e749f616ae25 (md5) previous issue date: 2007; ieee.; [zhou, kongdan; lu, huaxiang] chinese acad sci, inst semicond, lab artificial neural networks, beijing 100864, peoples r china
收录类别	CPCI-S
会议主办者	ieee.
会议录	2007 ieee international conference on control and automation
会议录出版者	ieee ; 345 e 47th st, new york, ny 10017 usa
会议录出版地	345 e 47th st, new york, ny 10017 usa
学科主题	人工智能
语种	英语
ISBN号	978-1-4244-0817-7
内容类型	会议论文
源URL	[http://ir.semi.ac.cn/handle/172111/7768]
专题	半导体研究所_中国科学院半导体研究所（2009年前）
推荐引用方式 GB/T 7714	Zhou, KD,Lu, HX. Simulation of single electronic device and robust circuit construction[C]. 见:ieee international conference on control and automation. guangzhou, peoples r china. may 30-jun 01, 2007.