Investigation of the 6H-SiC (0001) surface by AFM | |
Shouzhen Jiang[1,2]; Guangwei Yu[1]; Yingmin Wang[1]; Xiaobo Hu[1]; Xiangang Xu[1]; Minhua Jiang[1] | |
2008 | |
卷号 | 15期号:5页码:654-658 |
关键词 | 原子显微镜 电子聚束 多形体 6H-SiC |
URL标识 | 查看原文 |
内容类型 | 期刊论文 |
URI标识 | http://www.corc.org.cn/handle/1471x/6414827 |
专题 | 山东师范大学 |
作者单位 | 1.[1]State Key Laboratory of Crystal Materials, Shandong University, Jinan 250100, China 2.[2]College of Physics and Electronics, Shandong Normal University, Jinan, 250014, China |
推荐引用方式 GB/T 7714 | Shouzhen Jiang[1,2],Guangwei Yu[1],Yingmin Wang[1],等. Investigation of the 6H-SiC (0001) surface by AFM[J],2008,15(5):654-658. |
APA | Shouzhen Jiang[1,2],Guangwei Yu[1],Yingmin Wang[1],Xiaobo Hu[1],Xiangang Xu[1],&Minhua Jiang[1].(2008).Investigation of the 6H-SiC (0001) surface by AFM.,15(5),654-658. |
MLA | Shouzhen Jiang[1,2],et al."Investigation of the 6H-SiC (0001) surface by AFM".15.5(2008):654-658. |
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