Double hydrogenic impurities in double quantum dots
Wang, XF (Wang, Xue-Feng) ; Liu, YH (Liu, Yong-Hui)
刊名journal of applied physics
2007
卷号102期号:6页码:art.no.063708
关键词ELECTRONIC-STRUCTURE
ISSN号issn: 0021-8979
通讯作者wang, xf, chinese acad sci, inst semicond, state key lab superlattices & microstruct, pob 912, beijing 100083, peoples r china. 电子邮箱地址: wangxf@red.semi.ac.cn
中文摘要the ground states and degree of entanglement of double hydrogenic impurities in a pair of vertically stacked ingaas/gaas quantum dots are studied with a proposed diagonalization technique. it is found that at short barrier widths, the entanglement is small due to the coupling between the intra- and interdot orbitals. at large barrier widths, large entanglement occurs.
学科主题半导体物理
收录类别SCI
语种英语
公开日期2010-03-29
内容类型期刊论文
源URL[http://ir.semi.ac.cn/handle/172111/9250]  
专题半导体研究所_中国科学院半导体研究所(2009年前)
推荐引用方式
GB/T 7714
Wang, XF ,Liu, YH . Double hydrogenic impurities in double quantum dots[J]. journal of applied physics,2007,102(6):art.no.063708.
APA Wang, XF ,&Liu, YH .(2007).Double hydrogenic impurities in double quantum dots.journal of applied physics,102(6),art.no.063708.
MLA Wang, XF ,et al."Double hydrogenic impurities in double quantum dots".journal of applied physics 102.6(2007):art.no.063708.
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