Luminescence properties of multi-layer InGaN quantum dots grown on C- and R-plane sapphire substrates
Chen, Z ; Chua, SJ ; Han, PD ; Liu, XL ; Lu, DC ; Zhu, QS ; Wang, ZG ; Tripathy, S
刊名physica e-low-dimensional systems & nanostructures
2005
卷号27期号:3页码:314-318
关键词GaN
ISSN号1386-9477
通讯作者tripathy, s, inst mat res & engn, 3 res link, singapore 117602, singapore. 电子邮箱地址: tripathy-sudhiranjan@imre.a-star.edu.sg
中文摘要in this study, we report comparative luminescence properties of multi-layer ingan quantum dots grown on c- and r-plane sapphire substrates by metal organic chemical vapor deposition (mocvd). high-density ingan quantum dots (qds) are formed on gan templates by decreasing the growth temperature and increasing the adatom hopping-barrier through surface passivation. atomic force microscopy (afm) has been employed to estimate the size and height of these dots. photoluminescence (pl) spectra recorded from (1120) ingan qds/(1102) sapphire show much stronger emission intensity compared to spectra recorded from (0001) ingan qds/(0001) sapphire. due to the absence of strong spontaneous polarization and piezoelectric field, such (1150) ingan qds in the active layers would lead to high efficiency light emitting devices. (c) 2005 elsevier b.v. all rights reserved.
学科主题半导体材料
收录类别SCI
语种英语
公开日期2010-03-17
内容类型期刊论文
源URL[http://ir.semi.ac.cn/handle/172111/8794]  
专题半导体研究所_中国科学院半导体研究所(2009年前)
推荐引用方式
GB/T 7714
Chen, Z,Chua, SJ,Han, PD,et al. Luminescence properties of multi-layer InGaN quantum dots grown on C- and R-plane sapphire substrates[J]. physica e-low-dimensional systems & nanostructures,2005,27(3):314-318.
APA Chen, Z.,Chua, SJ.,Han, PD.,Liu, XL.,Lu, DC.,...&Tripathy, S.(2005).Luminescence properties of multi-layer InGaN quantum dots grown on C- and R-plane sapphire substrates.physica e-low-dimensional systems & nanostructures,27(3),314-318.
MLA Chen, Z,et al."Luminescence properties of multi-layer InGaN quantum dots grown on C- and R-plane sapphire substrates".physica e-low-dimensional systems & nanostructures 27.3(2005):314-318.
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