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	Ex situ atomic force microscopy studies of surface morphology on {001} faces of MMTWD crystals
	Liu XJ; Wang XQ; Wang ZY; Xu D; Yu GW; Song YY; Geng YL; Zhang HB
刊名	Surface review and letters
	2006
卷号	13期号:5页码:607-611
关键词	atomic force microscopy (AFM) surface morphology nonlinear optical materials MERCURY THIOCYANATE CRYSTALS STABILITY GROWTH DEFECTS FLOW
DOI	10.1142/S0218625X06008566
URL标识	查看原文
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/6289832
专题	山东大学
作者单位	1.State Key Laboratory of Crystal Materials, Institute of Crystal Materials, Shandona University, Ji'nan 250100, China 2.State Key
推荐引用方式 GB/T 7714	Liu XJ,Wang XQ,Wang ZY,et al. Ex situ atomic force microscopy studies of surface morphology on {001} faces of MMTWD crystals[J]. Surface review and letters,2006,13(5):607-611.
APA	Liu XJ.,Wang XQ.,Wang ZY.,Xu D.,Yu GW.,...&Zhang HB.(2006).Ex situ atomic force microscopy studies of surface morphology on {001} faces of MMTWD crystals.Surface review and letters,13(5),607-611.
MLA	Liu XJ,et al."Ex situ atomic force microscopy studies of surface morphology on {001} faces of MMTWD crystals".Surface review and letters 13.5(2006):607-611.

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