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	Logic operation-based Design for Testability method and parallel test algorithm for 1T1R crossbar
	Liu, Peng; You, Zhiqiang; Kuang, Jishun; Elimu, Michael; Cai, Shuo; Wang, Weizheng
刊名	Electronics Letters
	2017
卷号	Vol.53 No.25页码:1631-1632
ISSN号	0013-5194
URL标识	查看原文
公开日期	[db:dc_date_available]
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/6046469
专题	湖南大学
作者单位	1.Key Laboratory for Embedded and Network Computing of Hunan Province, College of Computer Science and Electronic Engineering, Hunan University, Changsha 2.410082, China 3.College of Computer and Communication Engineering, Changsha University of Scienc
推荐引用方式 GB/T 7714	Liu, Peng,You, Zhiqiang,Kuang, Jishun,et al. Logic operation-based Design for Testability method and parallel test algorithm for 1T1R crossbar[J]. Electronics Letters,2017,Vol.53 No.25:1631-1632.
APA	Liu, Peng,You, Zhiqiang,Kuang, Jishun,Elimu, Michael,Cai, Shuo,&Wang, Weizheng.(2017).Logic operation-based Design for Testability method and parallel test algorithm for 1T1R crossbar.Electronics Letters,Vol.53 No.25,1631-1632.
MLA	Liu, Peng,et al."Logic operation-based Design for Testability method and parallel test algorithm for 1T1R crossbar".Electronics Letters Vol.53 No.25(2017):1631-1632.

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