| Bayesian and Degradation data based Zero-failure Accelerated Life Demonstration Test for Electrical Products in High Speed Train System | |
| Xu, Dan; Feng, Zhixin | |
| 2017 | |
| 会议名称 | 2017 4TH INTERNATIONAL CONFERENCE ON TRANSPORTATION INFORMATION AND SAFETY (ICTIS) |
| 会议日期 | 2017-01-01 |
| 关键词 | Acclerated Life Demonstration Test High Speed Train System Bayesian Degradation Data Zero-failure |
| 页码 | 606-611 |
| 收录类别 | CPCI-S |
| URL标识 | 查看原文 |
| WOS记录号 | WOS:000413689400097 |
| 内容类型 | 会议论文 |
| URI标识 | http://www.corc.org.cn/handle/1471x/5944335 |
| 专题 | 北京航空航天大学 |
| 推荐引用方式 GB/T 7714 | Xu, Dan,Feng, Zhixin. Bayesian and Degradation data based Zero-failure Accelerated Life Demonstration Test for Electrical Products in High Speed Train System[C]. 见:2017 4TH INTERNATIONAL CONFERENCE ON TRANSPORTATION INFORMATION AND SAFETY (ICTIS). 2017-01-01. |
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