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	Real-time scan speed control of the atomic force microscopy for reducing imaging time based on sample topography
	Zhang, Yingxu; Li, Yingzi; Shan, Guanqiao; Chen, Yifu; Wang, Zhenyu; Qian, Jianqiang
刊名	MICRON
	2018
卷号	106页码:1-6
关键词	Atomic force microscopy Amplitude modulation Real-time control Fast imaging
ISSN号	0968-4328
DOI	10.1016/j.micron.2017.12.004
URL标识	查看原文
收录类别	SCIE ; EI ; PUBMED
WOS记录号	WOS:000425078900001
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/5936275
专题	北京航空航天大学
推荐引用方式 GB/T 7714	Zhang, Yingxu,Li, Yingzi,Shan, Guanqiao,et al. Real-time scan speed control of the atomic force microscopy for reducing imaging time based on sample topography[J]. MICRON,2018,106:1-6.
APA	Zhang, Yingxu,Li, Yingzi,Shan, Guanqiao,Chen, Yifu,Wang, Zhenyu,&Qian, Jianqiang.(2018).Real-time scan speed control of the atomic force microscopy for reducing imaging time based on sample topography.MICRON,106,1-6.
MLA	Zhang, Yingxu,et al."Real-time scan speed control of the atomic force microscopy for reducing imaging time based on sample topography".MICRON 106(2018):1-6.

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