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Voltage-Controlled Magnetic Tunnel Junctions for Processing-In-Memory Implementation
Wang, Lezhi; Kang, Wang; Ebrahimi, Farbod; Li, Xiang; Huang, Yangqi; Zhao, Chao; Wang, Kang L.; Zhao, Weisheng
刊名IEEE ELECTRON DEVICE LETTERS
2018
卷号39页码:440-443
关键词Magnetic tunnel junction processing-in-memory voltage-controlled magnetic anisotropy
ISSN号0741-3106
DOI10.1109/LED.2018.2791510
URL标识查看原文
收录类别SCIE ; EI
WOS记录号WOS:000426794100029
内容类型期刊论文
URI标识http://www.corc.org.cn/handle/1471x/5934984
专题北京航空航天大学
推荐引用方式
GB/T 7714
Wang, Lezhi,Kang, Wang,Ebrahimi, Farbod,et al. Voltage-Controlled Magnetic Tunnel Junctions for Processing-In-Memory Implementation[J]. IEEE ELECTRON DEVICE LETTERS,2018,39:440-443.
APA Wang, Lezhi.,Kang, Wang.,Ebrahimi, Farbod.,Li, Xiang.,Huang, Yangqi.,...&Zhao, Weisheng.(2018).Voltage-Controlled Magnetic Tunnel Junctions for Processing-In-Memory Implementation.IEEE ELECTRON DEVICE LETTERS,39,440-443.
MLA Wang, Lezhi,et al."Voltage-Controlled Magnetic Tunnel Junctions for Processing-In-Memory Implementation".IEEE ELECTRON DEVICE LETTERS 39(2018):440-443.
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