A new processing method for accelerated degradation data based on quantile regression and pseudo-failure lifetime | |
Yang, Jun; Shi, Xiao; Zhang, Jianchun | |
2018 | |
会议名称 | MICROELECTRONICS RELIABILITY |
会议日期 | 2018-09-01 |
关键词 | Accelerated degradation testing Quantile regression Pseudo-failure lifetime |
卷号 | 88-90 |
页码 | 1141-1145 |
收录类别 | CPCI-S |
URL标识 | 查看原文 |
WOS记录号 | WOS:000448227000210 |
内容类型 | 会议论文 |
URI标识 | http://www.corc.org.cn/handle/1471x/5928643 |
专题 | 北京航空航天大学 |
推荐引用方式 GB/T 7714 | Yang, Jun,Shi, Xiao,Zhang, Jianchun. A new processing method for accelerated degradation data based on quantile regression and pseudo-failure lifetime[C]. 见:MICROELECTRONICS RELIABILITY. 2018-09-01. |
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