| Nanoelectromechanical Switches by Controlled Switchable Cracking | |
| Luo, Qiang; Guo, Zhe; Huang, Houbing; Zou, Qiming; Jiang, Xiangwei; Zhang, Shuai; Wang, Hongjuan; Song, Min; Zhang, Bao; Chen, Hong | |
| 刊名 | IEEE ELECTRON DEVICE LETTERS
 |
| 2019 | |
| 卷号 | 40页码:1209-1212 |
| 关键词 | Nanoelectromechanical switch controlled nanocrack electric field control nonvolatile memory |
| ISSN号 | 0741-3106 |
| DOI | 10.1109/LED.2019.2917924 |
| URL标识 | 查看原文 |
| 收录类别 | SCIE ; EI |
| WOS记录号 | WOS:000473441400046 |
| 内容类型 | 期刊论文 |
| URI标识 | http://www.corc.org.cn/handle/1471x/5918574 |
| 专题 | 北京航空航天大学 |
| 推荐引用方式 GB/T 7714 | Luo, Qiang,Guo, Zhe,Huang, Houbing,et al. Nanoelectromechanical Switches by Controlled Switchable Cracking[J]. IEEE ELECTRON DEVICE LETTERS,2019,40:1209-1212. |
| APA | Luo, Qiang.,Guo, Zhe.,Huang, Houbing.,Zou, Qiming.,Jiang, Xiangwei.,...&You, Long.(2019).Nanoelectromechanical Switches by Controlled Switchable Cracking.IEEE ELECTRON DEVICE LETTERS,40,1209-1212. |
| MLA | Luo, Qiang,et al."Nanoelectromechanical Switches by Controlled Switchable Cracking".IEEE ELECTRON DEVICE LETTERS 40(2019):1209-1212. |
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