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	Measurement of impurity lines with two-crystal x-ray spectrometers on EAST
	Yang, Xinshuai; Hu, Ruiji; Chen, Jun; Wang, Fudi; Fu, Jia; Li, Yingying; Zhang, Hongming; Shen, Yongcai; Yin, Xianghui; Lyu, Bo*
刊名	Plasma Science and Technology
	2018
卷号	20期号:12页码:5-12
关键词	plasma diagnostics x-ray two-crystal spectrometer Doppler broadening dielectronic satellite
ISSN号	1009-0630
DOI	10.1088/2058-6272/aad177
URL标识	查看原文
WOS记录号	WOS:000444458600001
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/5692915
专题	南华大学
作者单位	1.[Zhang, Hongming 2.Lyu, Bo 3.Li, Yingying 4.EAST Team 5.Yang, Xinshuai 6.Fu, Jia 7.Wang, Fudi] Chinese Acad Sci, Inst Plasma Phys, Hefei 230031, Anhui, Peoples R China.
推荐引用方式 GB/T 7714	Yang, Xinshuai,Hu, Ruiji,Chen, Jun,et al. Measurement of impurity lines with two-crystal x-ray spectrometers on EAST[J]. Plasma Science and Technology,2018,20(12):5-12.
APA	Yang, Xinshuai.,Hu, Ruiji.,Chen, Jun.,Wang, Fudi.,Fu, Jia.,...&Lyu, Bo*.(2018).Measurement of impurity lines with two-crystal x-ray spectrometers on EAST.Plasma Science and Technology,20(12),5-12.
MLA	Yang, Xinshuai,et al."Measurement of impurity lines with two-crystal x-ray spectrometers on EAST".Plasma Science and Technology 20.12(2018):5-12.

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